Enam A. Chowdhury, Ph.D.

Affiliations: 
2004 University of Delaware, Newark, DE, United States 
Area:
Atomic
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"Enam Chowdhury"

Parents

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Barry Craig Walker grad student 2004 University of Delaware
 (Atomic response in ultra-intense fields.)
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Publications

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Shcherbakov MR, Sartorello G, Zhang S, et al. (2023) Nanoscale reshaping of resonant dielectric microstructures by light-driven explosions. Nature Communications. 14: 6688
Zhang S, Su Z, Menoni CS, et al. (2023) Influence of defects on the femtosecond laser damage resistance of multilayer dielectric gratings. Optics Letters. 48: 1212-1215
Hui D, Alqattan H, Zhang S, et al. (2023) Ultrafast optical switching and data encoding on synthesized light fields. Science Advances. 9: eadf1015
Zhang S, Menoni C, Gruzdev V, et al. (2022) Ultrafast Laser Material Damage Simulation-A New Look at an Old Problem. Nanomaterials (Basel, Switzerland). 12
Zhang S, Tripepi M, AlShafey A, et al. (2021) Femtosecond damage experiments and modeling of broadband mid-infrared dielectric diffraction gratings. Optics Express. 29: 39983-39999
Shcherbakov MR, Zhang H, Tripepi M, et al. (2021) Generation of even and odd high harmonics in resonant metasurfaces using single and multiple ultra-intense laser pulses. Nature Communications. 12: 4185
Werner K, Chowdhury E. (2021) Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon. Nanomaterials (Basel, Switzerland). 11
Snyder J, Morrison J, Feister S, et al. (2020) Background pressure effects on MeV protons accelerated via relativistically intense laser-plasma interactions. Scientific Reports. 10: 18245
Ngirmang GK, Morrison JT, George KM, et al. (2020) Evidence of radial Weibel instability in relativistic intensity laser-plasma interactions inside a sub-micron thick liquid target. Scientific Reports. 10: 9872
Talisa N, Alshafey A, Tripepi M, et al. (2020) Comparison of damage and ablation dynamics of multilayer dielectric films initiated by few-cycle pulses versus longer femtosecond pulses. Optics Letters. 45: 2672-2675
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