☰

Xinyuan Zhao, Ph.D.

Affiliations: 
2002 Rutgers University, New Brunswick, New Brunswick, NJ, United States 
Area:
Condensed Matter Physics
Google:
"Xinyuan Zhao"
Tree Publications Similar researchers PubMed Report error

Parents

Sign in to add mentor
David Hamilton Vanderbilt grad student 2002 Rutgers, New Brunswick
 (First-principles study of structural, vibrational, and dielectric properties of crystalline and amorphous oxides.)

Children

Sign in to add trainee

Collaborators

Sign in to add collaborator
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Liu K, Zhao X, Liu Q, et al. (2017) A novel multifunctional BODIPY-derived probe for the sequential recognition of Hg2+ and I−, and the fluorometric detection of Cr3+ Sensors and Actuators, B: Chemical. 239: 883-889
Zhao X, Fu L, Wang X, et al. (2017) Flue gas recovery system for natural gas combined heat and power plant with distributed peak-shaving heat pumps Applied Thermal Engineering. 111: 599-607
Zhu S, He L, Zhang F, et al. (2016) Fluorimetric evaluation of glutathione reductase activity and its inhibitors using carbon quantum dots Talanta. 161: 769-774
He L, Zhao X, Wang S, et al. (2016) The effects of rice-straw biochar addition on nitrification activity and nitrous oxide emissions in two Oxisols Soil and Tillage Research. 164: 52-62
Li H, Wang X, Liu C, et al. (2016) An efficient pretreatment for the selectively hydrothermal conversion of corncob into furfural: The combined mixed ball milling and ultrasonic pretreatments Industrial Crops and Products. 94: 721-728
Zhao X, Ceresoli D, Vanderbilt D. (2005) Structural, electronic, and dielectric properties of amorphous ZrO 2 from ab initio molecular dynamics Physical Review B - Condensed Matter and Materials Physics. 71
Sayan S, Nguyen NV, Ehrstein J, et al. (2005) Structural, electronic, and dielectric properties of ultrathin zirconia films on silicon Applied Physics Letters. 86: 1-3
Vanderbilt D, Zhao X, Ceresoli D. (2005) Structural and dielectric properties of crystalline and amorphous ZrO 2 Thin Solid Films. 486: 125-128
Sayan S, Emge T, Garfunkel E, et al. (2004) Band alignment issues related to HfO 2/SiO 2/p-Si gate stacks Journal of Applied Physics. 96: 7485-7491
Sayan S, Bartynski RA, Zhao X, et al. (2004) Valence and conduction band offsets of a ZrO2/SiO xNy/n-Si CMOS gate stack: A combined photoemission and inverse photoemission study Physica Status Solidi (B) Basic Research. 241: 2246-2252
See more...