Yuriy V. Danylyuk, Ph.D.
Affiliations: | 2005 | Wayne State University, Detroit, MI, United States |
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"Yuriy Danylyuk"Parents
Sign in to add mentor| Gregory Auner | grad student | 2005 | Wayne State | |
| (Growth and characterization of aluminum nitride, indium nitride, aluminum indium nitride semiconductors films and nanostructures.) | ||||
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Publications
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| Thakur JS, Dixit A, Danylyuk YV, et al. (2010) Investigation of E1 (LO) phonon-plasmon coupled modes and critical points in In1-x Gax N thin films by optical reflectance measurements Applied Physics Letters. 96 |
| McCullen EF, Thakur JS, Danylyuk YV, et al. (2008) Investigation of the occupation behavior for oxygen atoms in AlN films using Raman spectroscopy Journal of Applied Physics. 103 |
| Thakur JS, Danylyuk YV, Haddad D, et al. (2007) Influence of defects on the absorption edge of InN thin films: The band gap value Physical Review B - Condensed Matter and Materials Physics. 76 |
| Salakhutdinov I, Danylyuk Y, Chaganti K, et al. (2006) Model-independent method for the determination of guiding thin-film optical parameters. Applied Optics. 45: 6007-12 |
| Salakhutdinov IF, Danylyuk YV, Chaganti K, et al. (2005) A new model-independent method for the determination of guiding thin film optical parameters Optics Infobase Conference Papers |
| Georgiev DG, Rosenberger LW, Danylyuk YV, et al. (2005) Excimer laser modification of thin AlN films Applied Surface Science. 249: 45-53 |
| Naik VM, Haddad D, Danylyuk YV, et al. (2002) Infrared and ultraviolet Raman spectra of AlN thin films grown on Si(111) Materials Research Society Symposium - Proceedings. 693: 329-334 |
| Naik VM, Haddad D, Danylyuk YV, et al. (2001) Infrared and Ultraviolet Raman Spectra of AlN Thin Films Grown on Si(111) Mrs Proceedings. 693 |
| Danylyuk YV, Lukitsch MJ, Huang C, et al. (2001) Optical and electrical properties of Al1-xInxN films grown on sapphire (0001) by plasma source molecular beam epitaxy Materials Research Society Symposium - Proceedings. 639: G6.29.1-G6.29.5 |
| Naik VM, Weber WH, Uy D, et al. (2001) Ultraviolet and visible resonance-enhanced Raman scattering in epitaxial Al1-xInxN thin films Applied Physics Letters. 79: 2019-2021 |