Sachin Thanawala, Ph.D.
Affiliations: | 2006 | Wayne State University, Detroit, MI, United States |
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"Sachin Thanawala"Parents
Sign in to add mentorGregory Auner | grad student | 2006 | Wayne State | |
(Characterization of sputtered iridium oxide thin films on planar and laser micro-structured platinum thin film surfaces for neural stimulation applications.) |
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Publications
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Moening JP, Thanawala SS, Georgiev DG. (2009) Formation of microbumps and protrusions on metal thin films by localized laser irradiation 2009 Ieee Nanotechnology Materials and Devices Conference, Nmdc 2009. 169-173 |
Moening JP, Thanawala SS, Georgiev DG. (2009) Formation of high-aspect-ratio protrusions on gold films by localized pulsed laser irradiation Applied Physics a: Materials Science and Processing. 95: 635-638 |
Thanawala SS, Baird RJ, Georgiev DG, et al. (2008) Amorphous and crystalline IrO2 thin films as potential stimulation electrode coatings Applied Surface Science. 254: 5164-5169 |
Thanawala S, Palyvoda O, Georgiev DG, et al. (2007) A neural cell culture study on thin film electrode materials. Journal of Materials Science. Materials in Medicine. 18: 1745-52 |
Thanawala SS, Georgiev DG, Auner GW. (2007) Excimer laser fabrication of microbumps on platinum thin films Applied Physics Letters. 91 |
Thanawala S, Georgiev DG, Baird RJ, et al. (2007) Characterization of iridium oxide thin films deposited by pulsed-direct-current reactive sputtering Thin Solid Films. 515: 7059-7065 |
Thanawala S, Khan SP, Palyvoda O, et al. (2005) Surface modification and neural tissue culture of thin film electrode materials Materials Research Society Symposium Proceedings. 872: 359-364 |
Li B, Do K, Stuck J, et al. (2005) An organosiloxane spin on bottom antireflective coatings for ArF lithography Proceedings - Electrochemical Society. 326-336 |
Thanawala SS, Georgiev DG, Khan A, et al. (2004) Fabrication and characterization of platinum-iridium electrodes with micro-structured surfaces for neural stimulation applications Materials Research Society Symposium Proceedings. 820: 201-206 |