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Shinichiro Muramoto, Ph.D.

Affiliations: 
2011 University of Washington, Seattle, Seattle, WA 
Area:
Chemical Engineering
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"Shinichiro Muramoto"
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David G. Castner grad student 2011 University of Washington
 (Characterization of ToF-SIMS Primary Ion Sources for Biomedical Applications.)

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Muramoto S, Rading D, Bush B, et al. (2014) Low-temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60 and giant argon gas cluster sources. Rapid Communications in Mass Spectrometry : Rcm. 28: 1971-8
Brison J, Robinson MA, Benoit DS, et al. (2013) TOF-SIMS 3D imaging of native and non-native species within HeLa cells. Analytical Chemistry. 85: 10869-77
Muramoto S, Brison J, Castner DG. (2012) Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi n and C 60 ions in organic films Analytical Chemistry. 84: 365-372
Muramoto S, Graham DJ, Wagner MS, et al. (2011) ToF-SIMS Analysis of Adsorbed Proteins: Principal Component Analysis of the Primary Ion Species Effect on the Protein Fragmentation Patterns. The Journal of Physical Chemistry. C, Nanomaterials and Interfaces. 115: 24247-24255
Brison J, Benoit DS, Muramoto S, et al. (2011) ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine. Surface and Interface Analysis : Sia. 43: 354-357
Muramoto S, Brison J, Castner DG. (2011) ToF-SIMS depth profiling of trehalose: The effect of analysis beam dose on the quality of depth profiles Surface and Interface Analysis. 43: 58-61
Brison J, Benoit DSW, Muramoto S, et al. (2011) ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine Surface and Interface Analysis. 43: 354-357
Brison J, Muramoto S, Castner DG. (2010) ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis. The Journal of Physical Chemistry. C, Nanomaterials and Interfaces. 114: 5565-5573
Brison J, Muramoto S, Castner DG. (2010) ToF-SIMS depth profiling of organic films: A comparison between single-beam and dual-beam analysis Journal of Physical Chemistry C. 114: 5565-5573
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