Clément Fallet

Affiliations: 
École Polytechnique, Palaiseau, Île-de-France, France 
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"Clément Fallet"

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Antonello de Martino grad student 2011 École Polytechnique
 (Angle resolved Mueller polarimetry, applications to periodic structures)
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Publications

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Fallet C, Lassalle A, Dubois-Delumeau M, et al. (2016) Accurate axial localization by conical diffraction beam shaping generating a dark-helix PSF Proceedings of Spie. 9714: 971414
Arwin H, Magnusson R, Garcia-Caurel E, et al. (2015) Sum decomposition of Mueller-matrix images and spectra of beetle cuticles Optics Express. 23: 1951-1966
Fallet C, Dubois M, Tinevez J, et al. (2015) A new method to achieve tens of nm axial super-localization based on conical diffraction PSF shaping Proceedings of Spie. 9331
Rosset S, Fallet C, Sirat GY. (2014) Focusing by a high numerical aperture lens of distributions generated by conical diffraction. Optics Letters. 39: 6569-72
Caron J, Fallet C, Tinevez JY, et al. (2014) Conical diffraction illumination opens the way for low phototoxicity super-resolution imaging. Cell Adhesion & Migration. 8: 430-9
Fallet C, Caron J, Oddos S, et al. (2014) Conical diffraction as a versatile building block to implement new imaging modalities for superresolution in fluorescence microscopy Proceedings of Spie. 9169: 916905
Pierangelo A, Nazac A, Benali A, et al. (2013) Polarimetric imaging of uterine cervix: a case study. Optics Express. 21: 14120-30
Pierangelo A, Manhas S, Benali A, et al. (2013) Multispectral Mueller polarimetric imaging detecting residual cancer and cancer regression after neoadjuvant treatment for colorectal carcinomas. Journal of Biomedical Optics. 18: 046014
Pierangelo A, Manhas S, Benali A, et al. (2012) Ex vivo photometric and polarimetric multilayer characterization of human healthy colon by multispectral Mueller imaging. Journal of Biomedical Optics. 17: 066009
Fallet C, Novikova T, Jolibois A, et al. (2011) Overlay measurement by angle resolved Mueller polarimetry Proceedings of Spie - the International Society For Optical Engineering. 8160
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