Christopher R. Winkler, Ph.D.
Affiliations: | Materials Science and Engineering | Drexel University, Philadelphia, PA, United States |
Area:
Transmission electron microscopy, metallurgy, oxides, thin films, magnetoelectricsGoogle:
"Christopher Winkler"Mean distance: 4976.62
Parents
Sign in to add mentor| Mitra Lenore Taheri | grad student | 2014 | Drexel | |
| (Exploring Mechanisms of Ferroelectric Switching in Real Time Using In Situ TEM.) | ||||
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Publications
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| Liu G, Lei Q, Wolak MA, et al. (2016) Epitaxial strain and its relaxation at the LaAlO |
| Jablonski ML, Liu S, Winkler C, et al. (2015) Asymmetric Response of Ferroelastic Domain Wall Motion Under Applied Bias. Acs Applied Materials & Interfaces |
| Coward RA, Winkler CR, Hanson WA, et al. (2015) Transmission electron microscopy investigation of Ag diffusion mechanisms in β-SiC Journal of Nuclear Materials. 457: 298-303 |
| Winkler CR, Jablonski ML, Ashraf K, et al. (2014) Real-time observation of local strain effects on nonvolatile ferroelectric memory storage mechanisms. Nano Letters. 14: 3617-22 |
| Spurgeon S, Sloppy J, Winkler C, et al. (2013) Evidence for a Thickness-Dependent Crossover from Charge- to Strain-Mediated Magnetoelectric Coupling in La0.7Sr0.3MnO3 / PbZr0.2Ti0.8O3 Thin Film Oxide Heterostructures Microscopy and Microanalysis. 19: 1964-1965 |
| Majidi H, Winkler CR, Taheri ML, et al. (2012) Microstructural changes in CdSe-coated ZnO nanowires evaluated by in situ annealing in transmission electron microscopy and x-ray diffraction. Nanotechnology. 23: 265701 |
| Winkler CR, Damodaran AR, Karthik J, et al. (2012) Direct observation of ferroelectric domain switching in varying electric field regimes using in situ TEM. Micron (Oxford, England : 1993). 43: 1121-6 |
| Winkler CR, Jablonski ML, Damodaran AR, et al. (2012) Accessing intermediate ferroelectric switching regimes with time-resolved transmission electron microscopy Journal of Applied Physics. 112 |
| Spurgeon S, Sloppy J, Winkler C, et al. (2012) A Combined STEM-EELS and Neutron Reflectometry Study of Charge- and Strain-Mediated Magnetoelectric Coupling in LSMO/PZT Heterostructures Microscopy and Microanalysis. 18: 1912-1913 |
| Jablonski M, Winkler C, Taheri M, et al. (2012) In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films Microscopy and Microanalysis. 18: 1462-1463 |