Richard C. Sobers, Ph.D.
Affiliations: | Chemistry | Arizona State University, Tempe, AZ, United States |
Area:
secondary ion mass spectrometryGoogle:
"Richard Sobers"Mean distance: 14.11
Parents
Sign in to add mentor| Peter Williams | grad student | 2012 | Arizona State | |
| (Studies of Singly and Multiply Charged Secondary Ion Emission And The Effects Of Oxygen On Ionization And Sputter Erosion.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Williams P, Franzreb K, Sobers RC, et al. (2010) On the effect of oxygen flooding on the detection of noble gas ions in a SIMS instrument Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 268: 2758-2765 |
| Sommerfeld T, Franzreb K, Sobers RC, et al. (2006) Small silicon-oxygen dianions in the gas phase Chemical Physics. 329: 216-221 |
| Williams P, Sobers RC, Franzreb K, et al. (2006) Quantitative fundamental SIMS studies using 18O implant standards Applied Surface Science. 252: 6429-6432 |
| Franzreb K, Sobers RC, Lörinčik J, et al. (2005) Observation of small long-lived diatomic dications BeH2+ and BeD2+ Physical Review a - Atomic, Molecular, and Optical Physics. 71 |
| Franzreb K, Hrušák J, Alikhani ME, et al. (2005) Erratum: Gas-phase diatomic trications of Se23+, Te23+, and LaF3+ [J. Chem. Phys. 121, 12293 (2004)] The Journal of Chemical Physics. 123: 209901 |
| Franzreb K, Hrusák J, Alikhani ME, et al. (2004) Gas-phase diatomic trications of Se2(3+), Te2(3+), and LaF3+. The Journal of Chemical Physics. 121: 12293-302 |
| Franzreb K, Sobers RC, Lorincik J, et al. (2004) Formation of doubly positively charged diatomic ions of Mo2(2+) produced by Ar+ sputtering of an Mo metal surface. The Journal of Chemical Physics. 120: 7983-6 |
| Franzreb K, Sobers RC, Lörincík J, et al. (2004) Detection of the diatomic dications SiH2+ and AlH2+ Applied Surface Science. 231: 82-85 |
| Sobers RC, Franzreb K, Williams P. (2004) Quantitative measurement of O/Si ratios in oxygen-sputtered silicon using 18O implant standards Applied Surface Science. 231: 729-733 |