Eleni Dokou, Ph.D.
Affiliations: | 2001 | University of Delaware, Newark, DE, United States |
Area:
Heterogeneous catalysisGoogle:
"Eleni Dokou"Mean distance: 9.6 | S | N | B | C | P |
Parents
Sign in to add mentor| Mark Alan Barteau | grad student | 2001 | University of Delaware | |
| (Scanning probe microscopy studies of chemical and physical properties of particulate systems.) | ||||
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Publications
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| Dokou E, Zhang L, Barteau MA. (2002) Comparison of atomic force microscopy imaging methods and roughness determinations for a highly polished quartz surface Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 2183-2186 |
| Dokou E, Barteau MA, Wagner NJ, et al. (2001) Effect of Gravity on Colloidal Deposition Studied by Atomic Force Microscopy. Journal of Colloid and Interface Science. 240: 9-16 |
| Dokou E, Stangland EE, Andres RP, et al. (2000) Comparison of AFM and HRTEM to determine the metal particle morphology and loading of an Au/TiO2 catalyst Catalysis Letters. 70: 1-7 |
| Dokou E, Farneth WE, Barteau MA. (2000) Using atomic force microscopy (AFM) to study the surface structure of oxide and metal-decorated oxide particles Studies in Surface Science and Catalysis. 130: 3167-3172 |
| Farneth WE, Scott McLean R, Bolt JD, et al. (1999) Tapping mode atomic force microscopy studies of the photoreduction of Ag+ on individual submicrometer TiO2 particles Langmuir. 15: 8569-8573 |