Daniel R. Blasini, Ph.D.

Affiliations: 
2006 Cornell University, Ithaca, NY, United States 
Area:
fuel cells, batteries, and molecular assemblies for molecular electronics
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"Daniel Blasini"
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Héctor D. Abruña grad student 2006 Cornell
 (Characterization of thin films and thin film phenomena in electrochemically active systems via X-ray methods.)
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Publications

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McGuiness CL, Diehl GA, Blasini D, et al. (2010) Molecular self-assembly at bare semiconductor surfaces: cooperative substrate-molecule effects in octadecanethiolate monolayer assemblies on GaAs(111), (110), and (100). Acs Nano. 4: 3447-65
Smilgies DM, Blasini DR. (2007) Indexation scheme for oriented molecular thin films studied with grazing-incidence reciprocal-space mapping Journal of Applied Crystallography. 40: 716-718
Blasini DR, Rivnay J, Smilgies DM, et al. (2007) Observation of intermediate-range order in a nominally amorphous molecular semiconductor film Journal of Materials Chemistry. 17: 1458-1461
Blasini DR, Flores-Torres S, Smilgies DM, et al. (2006) Stepwise self-assembly of ordered supramolecular assemblies based on coordination chemistry. Langmuir : the Acs Journal of Surfaces and Colloids. 22: 2082-9
Blasini DR, Rochefort D, Fachini E, et al. (2006) Surface composition of ordered intermetallic compounds PtBi and PtPb Surface Science. 600: 2670-2680
Tremont RJ, Blasini DR, Cabrera CR. (2003) Controlled self-assembly of mercapto and silane terminated molecules at Cu surfaces Journal of Electroanalytical Chemistry. 556: 147-158
Blasini DR, Tremont RJ, Batina N, et al. (2003) Self-assembly of (3-mercaptopropyl)trimethoxysilane on iodine coated gold electrodes Journal of Electroanalytical Chemistry. 540: 45-52
Cabrera CR, Warner JD, Mueller CH, et al. (2001) Self-assembled 3-mercaptopropyltrimethoxysilane (MPS) on Ba0.5Sr0.5TiO3 as an adhesion layer for microwave devices Materials Research Society Symposium - Proceedings. 666: F911-F916
Cabrera CR, Tremont R, Blasini D, et al. (2001) Ferroelectric charge injection mosfet devices Integrated Ferroelectrics. 38: 269-277
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