Adam W. Tsen, Ph.D.
Affiliations: | 2013 | Cornell University, Ithaca, NY, United States |
Area:
molecule-like nanostructures, including carbon nanotubes and grapheneGoogle:
"Adam Tsen"Mean distance: 10.78 | S | N | B | C | P |
Parents
Sign in to add mentor| Jiwoong Park | grad student | 2013 | Cornell | |
| (Spatially resolved electrical transport in carbon-based nanomaterials.) | ||||
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Publications
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| Li S, Ye Z, Luo X, et al. (2020) Magnetic-Field-Induced Quantum Phase Transitions in a van der Waals Magnet Physical Review X. 10 |
| Kim HH, Jiang S, Yang B, et al. (2019) Magneto-Memristive Switching in a 2D Layer Antiferromagnet. Advanced Materials (Deerfield Beach, Fla.). e1905433 |
| Kim HH, Yang B, Tian S, et al. (2019) Tailored tunnel magnetoresistance response in three ultrathin chromium trihalides. Nano Letters |
| Yoo H, Engelke R, Carr S, et al. (2019) Atomic and electronic reconstruction at the van der Waals interface in twisted bilayer graphene. Nature Materials |
| Hovden R, Liu P, Schnitzer N, et al. (2018) Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 24: 387-395 |
| Kim HH, Yang B, Patel T, et al. (2018) One million percent tunnel magnetoresistance in a magnetic van der Waals heterostructure. Nano Letters |
| Hovden R, Tsen AW, Liu P, et al. (2016) Atomic lattice disorder in charge-density-wave phases of exfoliated dichalcogenides (1T-TaS2). Proceedings of the National Academy of Sciences of the United States of America |
| Liu P, Hovden R, Tsen AW, et al. (2016) Thickness and Stacking Sequence Determination of Exfoliated Dichalchogenides Using Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 22: 1456-1457 |
| Tsen AW, Hovden R, Wang D, et al. (2015) Structure and control of charge density waves in two-dimensional 1T-TaS2. Proceedings of the National Academy of Sciences of the United States of America |
| Hovden R, Alden J, Tsen AW, et al. (2014) Atomic imaging across strain boundaries in bilayer graphene with ADF-STEM and DF-TEM Microscopy and Microanalysis. 20: 1058-1059 |