Kanan P. Puntambekar, Ph.D.
Affiliations: | 2005 | University of Minnesota, Twin Cities, Minneapolis, MN |
Area:
Organic and Molecular ElectronicsGoogle:
"Kanan Puntambekar"Mean distance: 8.47 | S | N | B | C | P |
Parents
Sign in to add mentorC. Daniel Frisbie | grad student | 2005 | UMN | |
(Characterization of structural and electrostatic complexity in pentacene thin films by scanning probe microscopy.) |
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Publications
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Arnold HN, Cress CD, McMorrow JJ, et al. (2016) Tunable Radiation Response in Hybrid Organic-Inorganic Gate Dielectrics for Low-Voltage Graphene Electronics. Acs Applied Materials & Interfaces |
Lipson AL, Puntambekar K, Comstock DJ, et al. (2014) Nanoscale investigation of solid electrolyte interphase inhibition on li-ion battery MnO electrodes via atomic layer deposition of Al 2O3 Chemistry of Materials. 26: 935-940 |
Secor EB, Prabhumirashi PL, Puntambekar K, et al. (2013) Inkjet Printing of High Conductivity, Flexible Graphene Patterns. The Journal of Physical Chemistry Letters. 4: 1347-51 |
Puntambekar K, Stecker L, Ulmer K, et al. (2011) Improving the organic semiconductor- metal contact interface in printed high performance organic TFTs Materials Research Society Symposium Proceedings. 1402: 13-18 |
Volkman SK, Yin S, Bakhishev T, et al. (2011) Mechanistic studies on sintering of silver nanoparticles Chemistry of Materials. 23: 4634-4640 |
Mauldin CE, Puntambekar K, Murphy AR, et al. (2009) Solution-processable α,ω-distyryl oligothiophene semiconductors with enhanced environmental stability Chemistry of Materials. 21: 1927-1938 |
Pesavento PV, Puntambekar KP, Frisbie CD, et al. (2006) Film and contact resistance in pentacene thin-film transistors: Dependence on film thickness, electrode geometry, and correlation with hole mobility Journal of Applied Physics. 99 |
Puntambekar K, Dong J, Haugstad G, et al. (2006) Structural and electrostatic complexity at a pentacenc/insulator interface Advanced Functional Materials. 16: 879-884 |
Puntambekar KP, Pesavento PV, Frisbie CD. (2003) Surface potential profiling and contact resistance measurements on operating pentacene thin-film transistors by Kelvin probe force microscopy Applied Physics Letters. 83: 5539-5541 |