Maheswaran Surendra

Affiliations: 
1986-1991 Chemical and Biomolecular Engineering University of California, Berkeley, Berkeley, CA, United States 
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"Maheswaran Surendra"
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Publications

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Surendra M. (1995) Radiofrequency discharge benchmark model comparison Plasma Sources Science and Technology. 4: 56-73
Surendra M, Guarnieri CR, Selwyn GS, et al. (1995) Across wafer etch rate uniformity in a high density plasma reactor: Experiment and modeling Applied Physics Letters. 2415
Vahedi V, Surendra M. (1995) A Monte Carlo collision model for the particle-in-cell method: applications to argon and oxygen discharges Computer Physics Communications. 87: 179-198
Joubert O, Oehrlein GS, Surendra M, et al. (1994) Reactive ion etching lag investigation of oxide etching in fluorocarbon electron cyclotron resonance plasmas Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 12: 1957-1961
Joubert O, Oehrlein GS, Surendra M. (1994) Fluorocarbon high density plasma. VI. Reactive ion etching lag model for contact hole silicon dioxide etching in an electron cyclotron resonance plasma Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 12: 665-670
Dalvie M, Surendra M, Selwyn GS, et al. (1994) Detection and modelling of electrode topography effects on particle traps Plasma Sources Science and Technology. 3: 442-447
Surendra M, Vender D. (1994) Collisionless electron heating by radio-frequency plasma sheaths Applied Physics Letters. 65: 153-155
Surendra M. (1994) Study of capacitive rf discharge characteristics through particle simulations Ieee International Conference On Plasma Science. 136
Surendra M, Dalvie M. (1993) Moment analysis of rf parallel-plate-discharge simulations using the particle-in-cell with Monte Carlo collisions technique. Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics. 48: 3914-3924
Dalvie M, Selwyn GS, Surendra M, et al. (1993) Detection of particle traps by spatially resolved optical emission spectroscopy over grooved electrodes in radio frequency discharges Applied Physics Letters. 63: 3279-3281
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