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Henri Roulet, Ph.D.

Affiliations: 
Chemistry Université Pierre et Marie Curie, Paris, Île-de-France, France 
Area:
Physical Chemistry
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"Henri Roulet"
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Stéphane Carniato grad student 1992 Université Pierre et Marie Curie

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Carniato S, Dufour G, Rochet F, et al. (1994) Theory assisted interpretation of copper phthalocyanine core levels XPS spectra Journal of Electron Spectroscopy and Related Phenomena. 67: 189-209
Dufour G, Poncey C, Rochet F, et al. (1994) Copper phthalocyanine on Si(111)-7 × 7 and Si(001)-2 × 1 surfaces: an X-ray photoemission spectroscopy and synchrotron X-ray absorption spectroscopy study Surface Science. 319: 251-266
Sénémaud C, Driss-Khodja M, Gheorghiu A, et al. (1993) Electronic structure of silicon nitride studied by both soft x-ray spectroscopy and photoelectron spectroscopy Journal of Applied Physics. 74: 5042-5046
Cheang-Wong JC, Ortega C, Siejka J, et al. (1993) Study of CuOy layers on Si and MgO by a combination of ion beam analysis (RBS/NRA), X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) Applied Surface Science. 64: 313-327
Driss Khodja M, Dufour G, Gheorghiu A, et al. (1992) Electronic structure of laser-synthesized SiC by photoelectron and soft X-ray spectroscopy Materials Science and Engineering B. 11: 97-101
Rochet F, Roulet H, Dufour G, et al. (1992) Si(001) vicinal surface oxidation in O2: Angle-resolved Si 2p core-level study using synchroton radiation Applied Surface Science. 59: 117-134
Carniato S, Roulet H, Dufour G, et al. (1992) Electronic structure of nitrogen square planar copper complexes in Langmuir-Blodgett films Journal of Physical Chemistry. 96: 7072-7075
Carniato S, Roulet H, Dufour G, et al. (1992) Electronic structure of nitrogen square planar copper complexes in Langmuir-Blodgett films Journal of Physical Chemistry. 96: 7072-7075
Yous B, Robin S, Donnadieu A, et al. (1984) Chemical vapor deposition of tungsten oxides: A comparative study by X-ray photoelectron spectroscopy, X-ray diffraction and reflection high energy electron diffraction Materials Research Bulletin. 19: 1349-1354
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