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Thomas A. Germer

Affiliations: 
National Institute of Standards and Technology, Gaithersburg, MD, United States 
Area:
Optical scatter, polarization
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Parents

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Eugene E. Haller research assistant 1985 UC Berkeley (Physics Tree)
Wilson Ho grad student 1985-1992 Cornell
Lee J. Richter post-doc 1992-1994 NIST

Children

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Jung Hyeun Kim grad student 1999-2003 NIST

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Publications

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Germer TA. (2020) Evolution of transmitted depolarization in diffusely scattering media. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 37: 980-987
Germer TA. (2020) Scattering mechanism for quadratic evolution of depolarization Optics Letters. 45: 483
Angelo JP, Germer TA, Litorja M. (2019) Structured illumination Mueller matrix imaging. Biomedical Optics Express. 10: 2861-2868
Roccapriore KM, Lyvers DP, Brown DP, et al. (2018) Waveguide coupling via magnetic gratings with effective strips. Applied Sciences (Basel, Switzerland). 8
Fischer G, Drahi E, Foldyna M, et al. (2017) Plasma nanotexturing of silicon surfaces for photovoltaics applications: influence of initial surface finish on the evolution of topographical and optical properties. Optics Express. 25: A1057-A1071
Germer TA. (2017) Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene. Applied Optics. 56: 9333-9340
Germer TA, Sharma KA, Brown TG, et al. (2017) Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 34: 1974-1984
Liman CD, Germer TA, Sunday DF, et al. (2017) Modeling the polarized X-ray scattering from periodic nanostructures with molecular anisotropy Journal of Applied Crystallography. 50: 1677-1690
Germer TA. (2016) Bidirectional scattering distribution function measurements from volume diffusers: correction factors and associated uncertainties. Applied Optics. 55: 6978-82
Patrick HJ, Germer TA, Zarobila CJ, et al. (2016) Optical reflectance of pyrheliometer absorption cavities: progress toward SI-traceable measurements of solar irradiance. Applied Optics. 55: 6346-54
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