Children
Sign in to add trainee| Hamutal Moreshet | grad student | 2006 | Brown |
| Huiyuan Song | grad student | 2006 | Brown |
| Desta Tadesse | grad student | 2009 | Brown |
BETA: Related publications
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Publications
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| Rezaei E, Donato M, Patterson WR, et al. (2020) Fundamental Thermal Limits on Data Retention in Low-Voltage CMOS Latches and SRAM Ieee Transactions On Device and Materials Reliability. 20: 488-497 |
| Nepal K, Hashemi S, Tann H, et al. (2019) Automated High-Level Generation of Low-Power Approximate Computing Circuits Ieee Transactions On Emerging Topics in Computing. 7: 18-30 |
| Sun Y, Zhang F, Jiang H, et al. (2019) Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack Journal of Electronic Testing. 35: 887-900 |
| Donato M, Bahar RI, Patterson WR, et al. (2018) A Sub-Threshold Noise Transient Simulator Based on Integrated Random Telegraph and Thermal Noise Modeling Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 37: 643-656 |
| Papagiannopoulou D, Marongiu A, Moreshet T, et al. (2017) Edge-TM: Exploiting Transactional Memory for Error Tolerance and Energy Efficiency Acm Transactions in Embedded Computing Systems. 16: 1-18 |
| Bahar RI, Jones AK, Xie Y. (2015) Introduction to the special issue on reliable, resilient, and robust design of circuits and systems Acm Transactions On Design Automation of Electronic Systems. 20 |
| Nepal K, Alhelaly S, Dworak J, et al. (2015) Repairing a 3-D die-stack using available programmable logic Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 34: 849-861 |
| Ulusel O, Nepal K, Bahar RI, et al. (2014) Fast design exploration for performance, power and accuracy tradeoffs in FPGA-based accelerators Acm Transactions On Reconfigurable Technology and Systems. 7 |
| Dworak J, Nepal K, Alves N, et al. (2013) Using implications to choose tests through suspect fault identification Acm Transactions On Design Automation of Electronic Systems. 18: 14 |
| Ferri C, Papagiannopoulou D, Bahar RI, et al. (2012) NBTI - Aware data allocation strategies for scratchpad based embedded systems Journal of Electronic Testing: Theory and Applications (Jetta). 28: 349-363 |