Francois-Fabien Ferhani, Ph.D.
Affiliations: | 2008 | Stanford University, Palo Alto, CA |
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"Francois-Fabien Ferhani"Parents
Sign in to add mentor| Edward J. Mccluskey | grad student | 2008 | Stanford | |
| (Comparing partial and complete test sets and test metrics.) | ||||
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Publications
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| Ferhani FF, Saxena NR, McCluskey EJ, et al. (2008) How many test patterns are useless? Proceedings of the Ieee Vlsi Test Symposium. 23-28 |
| Ferhani FF, McCluskey EJ. (2007) Classifying bad chips and ordering test sets Proceedings - International Test Conference |
| McCluskey EJ, Al-Yamani A, Li JCM, et al. (2004) ELF-Murphy data on defects and test sets Proceedings of the Ieee Vlsi Test Symposium. 16-22 |