M Ray Mercer
Affiliations: | Texas A & M University, College Station, TX, United States |
Area:
Electronics and Electrical Engineering, Computer ScienceGoogle:
"M Mercer"Children
Sign in to add trainee| Zoran Stanojevic | grad student | 2002 | Texas A & M |
| Sooryong Lee | grad student | 2003 | Texas A & M |
| Jennifer L. Dworak | grad student | 2004 | Texas A & M |
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Publications
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| Tian Y, Grimaila MR, Shi W, et al. (2005) An optimal test pattern selection method to improve the defect coverage Proceedings - International Test Conference. 2005: 762-770 |
| Dworak J, Dorsey D, Wang A, et al. (2004) Excitation, observation, and ELF-MD: Optimization criteria for high quality test sets Proceedings of the Ieee Vlsi Test Symposium. 9-15 |
| Dworak J, Wingfield J, Mercer MR. (2004) A preliminary investigation of observation diversity for enhancing fortuitous detection of defects Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 460-468 |
| Dworak J, Cobb B, Wingfield J, et al. (2004) Balanced excitation and its effect on the fortuitous detection of dynamic defects Proceedings - Design, Automation and Test in Europe Conference and Exhibition. 2: 1066-1071 |
| Dworak J, Wingfield J, Mercer MR. (2003) Function-based dynamic compaction and its impact on test set sizes Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 2003: 167-174 |
| Tian Y, Grimaila MR, Shi W, et al. (2003) Minimizing defective part level using a linear programming-based optimal test selection method Proceedings of the Asian Test Symposium. 2003: 354-359 |
| Wang LC, Krstic A, Lee L, et al. (2003) Using Logic Models to Predict the Detection Behavior of Statistical Timing Defects Ieee International Test Conference (Tc). 1041-1050 |
| Dworak J, Wingfield J, Cobb B, et al. (2002) Fortuitous detection and its impact on test set sizes using stuck-at and transition faults Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 2002: 177-185 |
| Kapur R, Williams TW, Mercer MR. (2002) Directed-binary search in logic BIST diagnostics Proceedings -Design, Automation and Test in Europe, Date. 1121 |
| Lee S, Cobb B, Dworak J, et al. (2002) A new ATPG algorithm to limit test set size and achieve multiple detections of all faults Proceedings -Design, Automation and Test in Europe, Date. 94-99 |