G Mackulak
Affiliations: | Arizona State University, Tempe, AZ, United States |
Area:
Industrial Engineering, Computer ScienceGoogle:
"G Mackulak"
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Publications
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Ankenman BE, Bekki JM, Fowler J, et al. (2011) Simulation in production planning: An overview with emphasis on recent developments in cycle time estimation International Series in Operations Research and Management Science. 151: 565-591 |
Ferreira S, Shunk D, Collofello J, et al. (2011) Reducing the risk of requirements volatility: Findings from an empirical survey Journal of Software Maintenance and Evolution. 23: 375-393 |
Ferreira S, Collofello J, Shunk D, et al. (2009) Understanding the effects of requirements volatility in software engineering by using analytical modeling and software process simulation Journal of Systems and Software. 82: 1568-1577 |
Jimenez JA, Mackulak GT, Fowler JW. (2008) Levels of capacity and material handling system modeling for factory integration decision making in semiconductor wafer fabs Ieee Transactions On Semiconductor Manufacturing. 21: 600-613 |
Johnson RT, Fowler JW, Mackulak GT. (2005) A discrete event simulation model simplification technique Proceedings - Winter Simulation Conference. 2005: 2172-2176 |
Jimenez JA, Mackulak G, Fowler J. (2005) Efficient simulations for capacity analysis and automated material handling system design in semiconductor wafer fabs Proceedings - Winter Simulation Conference. 2005: 2157-2161 |
Johnson RT, Leach SE, Fowler JW, et al. (2004) Variance-based sampling for cycle time - Throughput confidence intervals Proceedings - Winter Simulation Conference. 1: 716-720 |
McNeill JE, Mackulak GT, Fowler JW. (2003) Indirect estimation of cycle time quantiles from discrete event simulation models using the cornish-fisher expansion Winter Simulation Conference Proceedings. 2: 1377-1382 |
Park S, Fowler JW, Mackulak GT, et al. (2002) D-optimal sequential experiments for generating a simulation-based cycle time-throughput curve Operations Research. 50: 981-990+1078 |
Rasmidatta C, Murray S, Fowler JW, et al. (2002) New approaches for simulation of wafer fabrication: The use of control variates and calibration metrics Winter Simulation Conference Proceedings. 2: 1414-1422 |