Ramakrishna Voorakaranam, Ph.D.
Affiliations: | 2002 | Georgia Institute of Technology, Atlanta, GA |
Area:
Electronics and Electrical EngineeringGoogle:
"Ramakrishna Voorakaranam"Parents
Sign in to add mentor| Abhijit Chatterjee | grad student | 2002 | Georgia Tech | |
| (Signature -based testing of analog and RF circuits.) | ||||
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Publications
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| Cherubal S, Voorakaranam R, Chatterjee A, et al. (2004) Concurrent RF test using optimized modulated RF stimuli Proceedings of the Ieee International Conference On Vlsi Design. 17: 1017-1022 |
| Voorakaranam R, Newby R, Cherubal S, et al. (2003) Production Deployment of a Fast Transient Testing Methodology for Analog Circuits: Case Study and Results Ieee International Test Conference (Tc). 1174-1181 |
| Voorakaranam R, Cherubal S, Chatterjee A. (2002) A signature test framework for rapid production testing of RF circuits Proceedings -Design, Automation and Test in Europe, Date. 186-191 |
| Voorakaranam R, Chatterjee A. (2000) Low-cost jitter measurement technique for phase-locked loops Midwest Symposium On Circuits and Systems. 2: 956-959 |