Dzmitry Maliuk, Ph.D.
Affiliations: | 2013 | Yale University, New Haven, CT |
Area:
Electronics and Electrical EngineeringGoogle:
"Dzmitry Maliuk"Parents
Sign in to add mentor| Yiorgos Makris | grad student | 2013 | Yale | |
| (Analog Neural Classifiers for Built-In Self-Test of Analog/RF Circuits.) | ||||
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Publications
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| Volanis G, Maliuk D, Lu Y, et al. (2016) On-die learning-based self-calibration of analog/RF ICs Proceedings of the Ieee Vlsi Test Symposium. 2016 |
| Maliuk D, Makris Y. (2015) An Experimentation Platform for On-Chip Integration of Analog Neural Networks: A Pathway to Trusted and Robust Analog/RF ICs. Ieee Transactions On Neural Networks and Learning Systems. 26: 1721-34 |
| Jin Y, Maliuk D, Makris Y. (2015) Hardware trojan detection in Analog/RF integrated circuits Secure System Design and Trustable Computing. 241-268 |
| Maliuk D, Makris Y. (2014) An analog non-volatile neural network platform for prototyping RF BIST solutions Proceedings -Design, Automation and Test in Europe, Date |
| Maliuk D, Makris Y. (2014) On-chip intelligence: A pathway to self-testable, tunable, and trusted analog/RF ICs Midwest Symposium On Circuits and Systems. 1077-1080 |
| Jin Y, Maliuk D, Makris Y. (2013) A post-deployment IC trust evaluation architecture Proceedings of the 2013 Ieee 19th International On-Line Testing Symposium, Iolts 2013. 224-225 |
| Maliuk D, Kupp N, Makris Y. (2012) Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier Proceedings of the Ieee Vlsi Test Symposium. 62-67 |
| Maliuk D, Makris Y. (2012) A dual-mode weight storage analog neural network platform for on-chip applications Iscas 2012 - 2012 Ieee International Symposium On Circuits and Systems. 2889-2892 |
| Jin Y, Maliuk D, Makris Y. (2012) Post-deployment trust evaluation in wireless cryptographic ICs Proceedings -Design, Automation and Test in Europe, Date. 965-970 |
| Maliuk D, Stratigopoulosz HG, Huang H, et al. (2010) Analog neural network design for RF built-in self-test Proceedings - International Test Conference |