Darrell L. Niemann, Ph.D.
Affiliations: | 2008 | Santa Clara University, Santa Clara, CA, United States |
Area:
Electronics and Electrical Engineering, Materials Science EngineeringGoogle:
"Darrell Niemann"Parents
Sign in to add mentorMahmudur Rahman | grad student | 2008 | Santa Clara University | |
(Experimental and theoretical investigations of field emission in carbon nanotubes and their multiscale integrated systems.) |
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Publications
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Barycza MC, Niemann DL, Gunther NG, et al. (2012) Wavelet-enhanced bayesian classification of surface nanostructures observed in pentacene thin films Vacuum. 86: 2067-2074 |
Al-Mousa A, Niemann DL, Gunther NG, et al. (2011) Systematic quantitative characterisation of surface nanostructures by scanning probe microscopy of thin-films Journal of Experimental Nanoscience. 6: 451-463 |
Al-Mousa A, Niemann DL, Niemann DJ, et al. (2011) Analysis of atomic force microscopy data for surface characterization using fuzzy logic Materials Characterization. 62: 706-715 |
Silan JL, Niemann DL, Ribaya BP, et al. (2010) Investigation of carbon nanotube field emitter geometry for increased current density Solid-State Electronics. 54: 1543-1548 |
Al-Mousa A, Niemann DL, Gunther NG, et al. (2009) Systematic quantitative characterization of surface nanostructures by scanning probe microscopy of thin-films Nanotechnology 2009: Fabrication, Particles, Characterization, Mems, Electronics and Photonics - Technical Proceedings of the 2009 Nsti Nanotechnology Conference and Expo, Nsti-Nanotech 2009. 1: 285-288 |
Killian JL, Zuckerman NB, Niemann DL, et al. (2008) Field emission properties of carbon nanotube pillar arrays Journal of Applied Physics. 103 |
Ribaya BP, Niemann DL, Makarewicz J, et al. (2008) An empirical study of dynamic properties of an individual carbon nanotube electron source system Solid-State Electronics. 52: 1680-1686 |
Niemann DL, Ribaya BP, Gunther N, et al. (2007) Effects of cathode structure on the field emission properties of individual multi-walled carbon nanotube emitters Nanotechnology. 18 |