Azadeh Davoodi, Ph.D.
Affiliations: | 2006 | University of Maryland, College Park, College Park, MD |
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"Azadeh Davoodi"Parents
Sign in to add mentor| Ankur Srivastava | grad student | 2006 | University of Maryland | |
| (Optimization schemes for variability -driven VLSI design automation.) | ||||
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Publications
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| Zeng W, Zhang B, Davoodi A. (2019) Analysis of Security of Split Manufacturing Using Machine Learning Ieee Transactions On Very Large Scale Integration Systems. 27: 2767-2780 |
| Hemmat M, Davoodi A. (2019) Power-efficient ReRAM-aware CNN model generation Integration. 69: 369-380 |
| Magana J, Shi D, Melchert J, et al. (2017) Are Proximity Attacks a Threat to the Security of Split Manufacturing of Integrated Circuits Ieee Transactions On Very Large Scale Integration Systems. 25: 3406-3419 |
| Shi D, Tashjian E, Davoodi A. (2017) Dynamic Planning of Local Congestion From Varying-Size Vias for Global Routing Layer Assignment Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 36: 1301-1312 |
| Davoodi A, Hu J, Ozdal M, et al. (2015) Guest Editorial: Special Section on Physical Design Techniques for Advanced Technology Nodes Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 34: 501 |
| Li M, Davoodi A. (2014) A hybrid approach for fast and accurate trace signal selection for post-silicon debug Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 33: 1081-1094 |
| Wu TH, Davoodi A, Linderoth JT. (2013) Power-driven global routing for multisupply voltage domains User Modeling and User-Adapted Interaction. 2013 |
| Shojaei H, Basten T, Geilen M, et al. (2013) A fast and scalable multidimensional multiple-choice knapsack heuristic Acm Transactions On Design Automation of Electronic Systems. 18 |
| Shojaei H, Davoodi A, Basten T. (2013) Collaborative multiobjective global routing Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 21: 1308-1321 |
| Xie L, Davoodi A. (2012) Post-silicon failing-path isolation incorporating the effects of process variations Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 1008-1018 |