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Frank E. Gennari, Ph.D.

Affiliations: 
2004 University of California, Berkeley, Berkeley, CA, United States 
Area:
Integrated Circuits (INC); Solid-State Devices
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Andrew R. Neureuther grad student 2004 UC Berkeley
 (Linking TCAD and EDA through pattern matching.)

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Publications

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Cain JP, Rodriguez NP, Sweis J, et al. (2014) A pattern-driven design regularization methodology Proceedings of Spie - the International Society For Optical Engineering. 9053
Teoh E, Dai V, Capodieci L, et al. (2014) Systematic data mining using a pattern database to accelerate yield ramp Proceedings of Spie - the International Society For Optical Engineering. 9053
Dai V, Lai YC, Gennari F, et al. (2014) Systematic physical verification with topological patterns Proceedings of Spie - the International Society For Optical Engineering. 9053
Yang J, Rodriguez N, Omedes O, et al. (2010) DRCPlus in a router: Automatic elimination of lithography hotspots using 2D pattern detection and correction Proceedings of Spie - the International Society For Optical Engineering. 7641
Neureuther AR, McIntyre G, Gennari F, et al. (2004) Feature level test patterns for characterizing residual process effects Proceedings of Spie - the International Society For Optical Engineering. 5379: 76-84
Hafeman S, Gennari F, Neureuther AR. (2004) Fast algorithm for extraction of worst-case image degradation due to flare Proceedings of Spie - the International Society For Optical Engineering. 5377: 1397-1404
Gennari FE, Neureuther AR. (2004) A pattern matching system for linking TCAD and EDA Proceedings - 5th International Symposium On Quality Electronic Design, Isqued 2004. 165-170
Gennari F, Madahar S, Neureuther AR. (2003) Web tool for worst-case assessment of aberration effects in printing a layout Proceedings of Spie - the International Society For Optical Engineering. 5040: 1591-1599
Gennari FE, Robins G, Neureuther AR. (2002) Validation of the aberration pattern-matching OPC strategy Proceedings of Spie - the International Society For Optical Engineering. 4692: 444-453
Neureuther AR, Gennari F. (2002) No-fault assurance: Linking fast process CAD and EDA Proceedings of Spie - the International Society For Optical Engineering. 4889: 871-878
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