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Degang Chen

Affiliations: 
Electrical and Computer Engineering Iowa State University, Ames, IA, United States 
Area:
Electronics and Electrical Engineering
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"Degang Chen"
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Parents

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Children

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Xuezhen Wang grad student 2003 Iowa State
Hanjun Jiang grad student 2005 Iowa State
Le Jin grad student 2006 Iowa State
Yu Lin grad student 2006 Iowa State
Haibo Fei grad student 2007 Iowa State
Chengming He grad student 2007 Iowa State
Vipul Katyal grad student 2008 Iowa State
Hanqing Xing grad student 2008 Iowa State
Jun He grad student 2010 Iowa State
Jingbo Duan grad student 2011 Iowa State
Siva K. Sudani grad student 2013 Iowa State
Tao Zeng grad student 2013 Iowa State
Amany El Gouhary grad student 2014 Iowa State

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Publications

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Wu M, Ban C, Xu J, et al. (2020) MIRE: A Multitone Identification and Replacement Method for Multitone Spectral Test Without Requiring Coherent Sampling Ieee Transactions On Instrumentation and Measurement. 69: 4578-4591
Chen T, Park C, Meng H, et al. (2020) A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test Ieee Transactions On Instrumentation and Measurement. 69: 3516-3526
Chen T, Park C, Chaganti SK, et al. (2020) An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method Ieee Transactions On Instrumentation and Measurement. 69: 729-738
Park C, Chen T, Noh K, et al. (2020) A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier Ieee Transactions On Circuits and Systems I-Regular Papers. 1-12
Duan Y, Wu H, Shimanouchi M, et al. (2019) A Low-Cost Comparator-Based Method for Accurate Decomposition of Deterministic Jitter in High-Speed Links Ieee Transactions On Electromagnetic Compatibility. 1-11
Duan Y, Chen D. (2019) Fast and Accurate Decomposition of Deterministic Jitter Components in High-Speed Links Ieee Transactions On Electromagnetic Compatibility. 1-9
Zhuang Y, Magstadt B, Chen T, et al. (2018) High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC–ADC Co-Testing Ieee Transactions On Instrumentation and Measurement. 67: 279-287
Chen T, Jin X, Geiger RL, et al. (2018) USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test Ieee Transactions On Circuits and Systems I-Regular Papers. 65: 2059-2069
Zhuang Y, Chen D. (2017) Accurate Spectral Testing With Non-Coherent Sampling for Multi-Tone Test Ieee Transactions On Circuits and Systems Ii-Express Briefs. 64: 1357-1361
Duan Y, Chen T, Chen D. (2017) A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm Journal of Electronic Testing. 33: 709-720
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