Anthony P. Ambler
Affiliations: | Electrical and Computer Engineering | University of Texas at Austin, Austin, Texas, U.S.A. | |
University of South Carolina, Columbia, SC |
Area:
Electronics and Electrical EngineeringWebsite:
https://www.scetv.org/stories/2015/qa-anthony-ambler-dean-college-engineering-and-computing-uscGoogle:
"Anthony Ambler"Bio:
Children
Sign in to add traineeHyun-Moo Kim | grad student | 2002 | UT Austin |
Songjun Lee | grad student | 2002 | UT Austin |
Taikyeong Jeong | grad student | 2004 | UT Austin |
Yu-Ting Lin | grad student | 2005 | UT Austin |
John M. Stawasz | grad student | 2005 | UT Austin |
Jingyu Hu | grad student | 2007 | UT Austin |
Hyuk Park | grad student | 2007 | UT Austin |
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Publications
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Iftikhar K, Jeong TT, Park G, et al. (2009) A HW/SW co-design methodology: An accurate power efficiency model and design metrics for embedded system 10th Acis Conference On Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, Snpd 2009, in Conjunction With Iwea 2009 and Weacr 2009. 3-7 |
Lee S, Ambler AP. (2007) Cost effective test planning for system-on-chip manufacture Autotestcon (Proceedings). 86-92 |
Jeong TT, Ambler AP. (2006) Power efficiency system for flight application (PESFA) mission Ieee Transactions On Aerospace and Electronic Systems. 42: 1515-1520 |
Jeong TT, Ambler AP. (2006) Design trade-offs and power reduction techniques for high performance circuits and system Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 3984: 531-536 |
Dislis C, Dick J, Ambler AP. (1993) Algorithms for cost optimized test strategy selection Proceedings of the International Test Conference. 383-391 |
Dislis C, Ambler AP, Dear ID, et al. (1993) Economics in design and test Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 384-387 |
Dear ID, Dislis C, Lau SC, et al. (1989) Hierarchical testability measurement and design for test selection by cost prediction . 50-57 |
Ambler AP, Musgrave G. (1988) DESIGN FOR TESTABILITY IN THE DIGITAL ENVIRONMENT New Electronics. 21: 43-44 |
Ambler AP, Paraskeva M, Burrows DF, et al. (1986) ECONOMICALLY VIABLE AUTOMATIC INSERTION OF SELF-TEST FEATURES FOR CUSTOM VLSI Digest of Papers - International Test Conference. 232-243 |
Ambler AP. (1983) TEACHING OF TESTING AND DESIGN FOR TESTABILITY AT UNDERGRADUATE AND POSTGRADUATE LEVEL Iee Colloquium (Digest) |