Robert J. Hocken
Affiliations: | Mechanical Engineering (PhD) | University of North Carolina, Charlotte, Charlotte, NC, United States |
Area:
Mechanical EngineeringWebsite:
https://mees.charlotte.edu/directory/robert-j-hockenGoogle:
"Robert Hocken"Bio:
http://www.physics.sunysb.edu/Physics/about/PAhist/1973.htm Hocken, Robert, Wilcox, Refractive Index of Xenon Near Critical Point
https://ui.adsabs.harvard.edu/abs/1973PhDT........70H/abstract
Parents
Sign in to add mentor| Lee R Wilcox | grad student | 1973 | SUNY Stony Brook (Physics Tree) | |
| (The Refractive-Index of Xenon Near the Critical-Point) | ||||
| Michael R Moldover | post-doc | 1973-1975 | National Instittute of Standards and Technology (Physics Tree) | |
Children
Sign in to add trainee| James G. Salsbury | grad student | 2000 | UNC Charlotte |
| Kwang S. Kang | grad student | 2001 | UNC Charlotte |
| Marcin B. Bauza | grad student | 2005 | UNC Charlotte |
| Ronnie R. Fesperman | grad student | 2007 | UNC Charlotte |
| Eric S. Buice | grad student | 2008 | UNC Charlotte |
| Ozkan Ozturk | grad student | 2008 | UNC Charlotte |
| James P. Phipps | grad student | 2010 | UNC Charlotte |
| Kang Ni | grad student | 2014 | UNC Charlotte |
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Publications
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| Fesperman R, Ozturk O, Hocken R, et al. (2012) Multi-scale Alignment and Positioning System - MAPS Precision Engineering. 36: 517-537 |
| Ni K, Hocken RJ. (2012) Dimensional metrology of plasmonic nanolithography machine Proceedings - Aspe 2012 Summer Topical Meeting: Precision Engineering and Mechatronics Supporting the Semiconductor Industry. 53: 42-44 |
| Torralba M, Valenzuela M, Acero R, et al. (2012) Error budgeting as a tool for the design of a 2D moving platform with nanometer resolution Proceedings of the 12th International Conference of the European Society For Precision Engineering and Nanotechnology, Euspen 2012. 1: 202-205 |
| Ramu P, Yagüe JA, Hocken RJ, et al. (2011) Development of a parametric model and virtual machine to estimate task specific measurement uncertainty for a five-axis multi-sensor coordinate measuring machine Precision Engineering. 35: 431-439 |
| Amin-Shahidi D, Ljubicic D, Overcash J, et al. (2010) High-Accuracy Atomic-Force-Microscope Head For Dimensional Metrology Ifac Proceedings Volumes. 43: 227-231 |
| Ruben SD, Tsao TC, Hocken RJ, et al. (2010) Mechatronics and control of a precision motion stage for nano-manufacturing Proceedings of the Asme Dynamic Systems and Control Conference 2009, Dscc2009. 803-810 |
| Overcash JL, Hocken RJ, Amin-Shahidi D, et al. (2010) Measurements using the high accuracy atomic force microscope and the sub-atomic measuring machine Proceedings - Aspe 2010 Annual Meeting. 50: 254-257 |
| Wang W, Hocken RJ, Zhu Z, et al. (2010) A piezodriven three dimensional micropositioning stage for nano-manufacturing 10th International Symposium On Measurement and Quality Control 2010, Ismqc 2010. 563-566 |
| Edward K, Farahi F, Hocken R. (2009) Hybrid shear force feedback/scanning quantitative phase microscopy applied to subsurface imaging. Optics Express. 17: 18408-18 |
| Buice ES, Otten D, Yang RH, et al. (2009) Design evaluation of a single-axis precision controlled positioning stage Precision Engineering. 33: 418-424 |