John A. Woollam

Affiliations: 
Engineering The University of Nebraska - Lincoln, Lincoln, NE 
Area:
Materials Science Engineering, Optics Physics, Biomedical Engineering
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"John Woollam"
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Mock A, VanDerslice J, Korlacki R, et al. (2018) Elevated temperature dependence of the anisotropic visible-to-ultraviolet dielectric function of monoclinic β-Ga2O3 Applied Physics Letters. 112: 041905
Hofmann T, Knight S, Sekora D, et al. (2017) Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry Applied Surface Science. 421: 513-517
Mock A, Carlson T, VanDerslice J, et al. (2017) Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry Applied Surface Science. 421: 663-666
Kühne P, Herzinger CM, Schubert M, et al. (2014) Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument. The Review of Scientific Instruments. 85: 071301
Kühne P, Darakchieva V, Yakimova R, et al. (2013) Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect. Physical Review Letters. 111: 077402
Hofmann T, Schmidt D, Boosalis A, et al. (2012) Metal slanted columnar thin film THz optical sensors Mrs Proceedings. 1409
Hofmann T, Kühne P, Schöche S, et al. (2012) Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures Applied Physics Letters. 101: 192102
Hofmann T, Schmidt D, Boosalis A, et al. (2011) THz dielectric anisotropy of metal slanted columnar thin films Applied Physics Letters. 99: 081903
Schöche S, Shi J, Boosalis A, et al. (2011) Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures Applied Physics Letters. 98
Hofmann T, Boosalis A, Kühne P, et al. (2011) Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry Applied Physics Letters. 98: 041906
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