Chirayu S. Amin, Ph.D.
Affiliations: | 2005 | Northwestern University, Evanston, IL |
Area:
Electronics and Electrical Engineering, Computer ScienceGoogle:
"Chirayu Amin"Parents
Sign in to add mentorYehea I. Ismail | grad student | 2005 | Northwestern | |
(Timing analysis of high performance integrated circuits.) |
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Publications
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Mukherjee P, Amin CS, Li P. (2014) Approximate property checking of mixed-signal circuits Proceedings - Design Automation Conference |
Amin CS, Dartu F, Ismail YI. (2005) Weibull-based analytical waveform model Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 24: 1156-1168 |
Amin CS, Chowdhury MH, Ismail YI. (2005) Realizable reduction of interconnect circuits including self and mutual inductances Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 24: 271-277 |
Amin CS, Ismail YI, Dartu F. (2005) Piece-wise approximations of RLCK circuit responses using moment matching Proceedings - Design Automation Conference. 927-932 |
Amin CS, Menezes N, Killpack K, et al. (2005) Statistical static timing analysis: How simple can we get? Proceedings - Design Automation Conference. 652-657 |
Ismail YI, Amin CS. (2004) Computation of signal-threshold crossing times directly from higher order moments Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 23: 1264-1276 |
Ismall YI, Amin CS. (2004) Computation of signal threshold crossing times directly from higher order moments Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 246-253 |
Amin CS, Dartu F, Ismail YI. (2004) Modeling unbuffered latches for timing analysis Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 254-260 |
Amin CS, Dartu F, Ismail YI. (2003) Weibull Based Analytical Waveform Model Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers. 161-168 |
Amin CS, Chowdhury MH, Ismail YI. (2003) Realizable RLCK circuit crunching Proceedings - Design Automation Conference. 226-231 |