Debayan Bhaduri, Ph.D.
Affiliations: | 2007 | Virginia Polytechnic Institute and State University, Blacksburg, VA, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Debayan Bhaduri"Parents
Sign in to add mentor| Sandeep K. Shukla | grad student | 2007 | Virginia Tech | |
| (Design and analysis of defect- and fault-tolerant nano-computing systems.) | ||||
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Publications
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| Ahuja S, Singh G, Bhaduri D, et al. (2009) Fault- and Defect-Tolerant Architectures for Nanocomputing Bio-Inspired and Nanoscale Integrated Computing. 263-293 |
| Coker A, Taylor V, Bhaduri D, et al. (2008) Multijunction fault-tolerance architecture for nanoscale crossbar memories Ieee Transactions On Nanotechnology. 7: 202-208 |
| Bhaduri D, Shukla SK. (2008) Chapter 6 Probabilistic Analysis of Self-Assembled Molecular Networks Studies in Multidisciplinarity. 5: 123-151 |
| Bhaduri D, Shukla S, Graham P, et al. (2007) Scalable techniques and tools for reliability analysis of large circuits Proceedings of the Ieee International Conference On Vlsi Design. 705-710 |
| Bhaduri D, Shukla S, Graham P, et al. (2007) Comparing reliability-redundancy tradeoffs for two von Neumann multiplexing architectures Ieee Transactions On Nanotechnology. 6: 265-279 |
| Bhaduri D, Shukla SK, Graham PS, et al. (2007) Reliability analysis of large circuits using scalable techniques and tools Ieee Transactions On Circuits and Systems I: Regular Papers. 54: 2447-2460 |
| Bhaduri D, Shukla S, Coker D, et al. (2006) A hybrid framework for design and analysis of fault-tolerant architectures Proceedings -Design, Automation and Test in Europe, Date. 1 |
| Coker A, Taylor V, Bhaduri D, et al. (2006) Multi-junction fault tolerance architecture for nanoscale crossbar memories 2006 6th Ieee Conference On Nanotechnology, Ieee-Nano 2006. 2: 512-515 |
| Bhaduri D, Shukla SK, Graham P, et al. (2006) Methods and tools for reliability driven defect-and fault-tolerant design of nanosystems 2006 6th Ieee Conference On Nanotechnology, Ieee-Nano 2006. 1: 359-362 |
| Bhaduri D, Shukla S. (2005) NANOLAB - A tool for evaluating reliability of defect-tolerant nanoarchitectures Ieee Transactions On Nanotechnology. 4: 381-394 |