Korhan Demirkan, Ph.D.
Affiliations: | 2008 | Department of Materials Science and Engineering | University of Delaware, Newark, DE, United States |
Area:
Materials Science Engineering, Electronics and Electrical Engineering, Physical ChemistryGoogle:
"Korhan Demirkan"Parents
Sign in to add mentorRobert Leon Opila | grad student | 2008 | University of Delaware | |
(Interfaces of electrical contacts in organic semiconductor devices.) |
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Publications
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Hannigan K, Reid M, Collins MN, et al. (2012) Corrosion of RoHS-compliant surface finishes in corrosive mixed flowing gas environments Journal of Electronic Materials. 41: 611-623 |
Demirkan K, Derkits GE, Fleming DA, et al. (2010) Corrosion of Cu under highly corrosive environments Journal of the Electrochemical Society. 157 |
Demirkan K, Mathew A, Weiland C, et al. (2008) Energy level alignment at organic semiconductor/metal interfaces: effect of polar self-assembled monolayers at the interface. The Journal of Chemical Physics. 128: 074705 |
Demirkan K, Mathew A, Weiland C, et al. (2008) Reactivity and morphology of vapor-deposited Al/polymer interfaces for organic semiconductor devices Journal of Applied Physics. 103 |
Lu P, Demirkan K, Opila RL, et al. (2008) Room-temperature chemical vapor deposition of aluminum and aluminum oxides on alkanethiolate self-assembled monolayers Journal of Physical Chemistry C. 112: 2091-2098 |
Mathew A, Demirkan K, Wang CG, et al. (2005) X-ray photoelectron spectroscopy of high-κ dielectrics Aip Conference Proceedings. 788: 85-91 |
Mathew A, Demirkan K, Opila RL, et al. (2005) Investigation of nitrided hafnium silicates for high-k dielectrics using photoelectron spectroscopy Proceedings - Electrochemical Society. 360-365 |
Demirkan K, Mathew A, Opila RL. (2003) Photoelectron spectroscopy investigation of high-k dielectrics Proceedings - Electrochemical Society. 22: 299-306 |