Ashok K. Palaniswamy, Ph.D.

Affiliations: 
2014 Electrical and Computer Engineering Southern Illinois University at Carbondale, Carbondale, IL 
Area:
Electronics and Electrical Engineering, Computer Engineering
Google:
"Ashok Palaniswamy"

Parents

Sign in to add mentor
Spyros Tragoudas grad student 2014 SIU Carbondale
 (Synthesis and testing of threshold logic circuits.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Palaniswamy AK, Tragoudas S, Haniotakis T. (2016) ATPG for Delay Defects in Current Mode Threshold Logic Circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 35: 1903-1913
Palaniswamy AK, Tragoudas S. (2014) Improved threshold logic synthesis using implicant-implicit algorithms Acm Journal On Emerging Technologies in Computing Systems. 10
Palaniswamy AK, Tragoudas S, Haniotakis T. (2014) ATPG for transition faults of pipelined threshold logic circuits Proceedings - 2014 9th Ieee International Conference On Design and Technology of Integrated Systems in Nanoscale Era, Dtis 2014
Palaniswamy AK, Tragoudas S. (2012) An efficient heuristic to identify threshold logic functions Acm Journal On Emerging Technologies in Computing Systems. 8
Palaniswamy AK, Tragoudas S. (2012) A scalable threshold logic synthesis method using ZBDDs Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 307-310
Palaniswamy AK, Goparaju MK, Tragoudas S. (2010) Scalable identification of threshold logic functions Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 269-273
Palaniswamy AK, Goparaju MK, Tragoudas S. (2009) A fault tolerant threshold logic gate design Proceedings of the 13th Wseas International Conference On Circuits - Held as Part of the 13th Wseas Cscc Multiconference. 162-167
Goparaju MK, Palaniswamy AK, Tragoudas S. (2008) A fault tolerance aware synthesis methodology for threshold logic gate networks Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 176-183
See more...