Xiaobin Yuan, Ph.D.
Affiliations: | 2006 | Lehigh University, Bethlehem, PA, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Xiaobin Yuan"Parents
Sign in to add mentor| James C. Hwang | grad student | 2006 | Lehigh University | |
| (Characterization and modeling of dielectric -charging effects in RF MEMS capacitive switches.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Yuan X, Owczarczyk P, Drake AJ, et al. (2015) Design Considerations for Reconfigurable Delay Circuit to Emulate System Critical Paths Ieee Transactions On Very Large Scale Integration Systems. 23: 2714-2718 |
| Yuan X, Zhang Q, Tran H, et al. (2012) Effect of SiGe channel on pFET variability in 32 nm technology Electronics Letters. 48: 273-274 |
| Yuan X, Shimizu T, Mahalingam U, et al. (2011) Transistor mismatch properties in deep-submicrometer CMOS technologies Ieee Transactions On Electron Devices. 58: 335-342 |
| Yuan X, Shimizu T, Mahalingam U, et al. (2010) Transistor mismatch in 32nm high-k metal-gate process Electronics Letters. 46: 708-709 |
| Yuan X, Park J, Wang J, et al. (2008) Gate-Induced-Drain-Leakage Current in 45-nm CMOS Technology Ieee Transactions On Device and Materials Reliability. 8: 501-508 |
| Yuan X, Peng Z, Hwang JCM, et al. (2006) A transient SPICE model for dielectric-charging effects in RF MEMS capacitive switches Ieee Transactions On Electron Devices. 53: 2640-2648 |
| Yuan X, Peng Z, Hwang JCM, et al. (2006) Acceleration of Dielectric Charging in RF MEMS Capacitive Switches Ieee Transactions On Device and Materials Reliability. 6: 556-563 |