Miltiadis K. Hatalis

Affiliations: 
Electrical Engineering Lehigh University, Bethlehem, PA, United States 
Area:
Electronics and Electrical Engineering, Materials Science Engineering, Mechanical Engineering
Website:
https://engineering.lehigh.edu/faculty/miltiadis-k-hatalis
Google:
"Miltiadis K. Hatalis"
Bio:

https://elibrary.ru/item.asp?id=7536599
DOI: 10.1557/PROC-106-335

Parents

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David W. Greve grad student 1987 Carnegie Mellon
 (Low temperature crystallization of amorphous LPCVD silicon films and application to bipolar and thin film transistors)
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Publications

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Charisoulis T, Reiman C, Frey D, et al. (2019) Current Feedback Compensation Circuit for 2T1C LED Displays: Analysis and Evaluation Ieee Transactions On Circuits and Systems I-Regular Papers. 66: 175-188
Charisoulis T, Frey D, Hatalis MK. (2015) Current feedback compensation circuit for 2T1C LED displays: Method Ieee Transactions On Circuits and Systems I: Regular Papers. 62: 2423-2433
Mahmoudabadi F, Chuang T, Kung JH, et al. (2014) High Performance IGZO TFTs with Modified Etch Stop Structure on Glass Substrates Mrs Proceedings. 1633: 95-100
Mahmoudabadi F, Ma X, Hatalis MK, et al. (2014) Amorphous IGZO TFTs and circuits on conformable aluminum substrates Solid-State Electronics. 101: 57-62
Charisoulis T, Troccoli MN, Frey DR, et al. (2014) Novel analog feedback current programming architecture compatible with 2-transistor 1-capacitor pixel for active matrix organic light-emitting diode displays Journal of the Society For Information Display. 22: 204-215
Tsormpatzoglou A, Hastas NA, Mahmoudabadi F, et al. (2013) Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements Ieee Electron Device Letters. 34: 1403-1405
Tsormpatzoglou A, Hastas NA, Choi N, et al. (2013) Analytical surface-potential-based drain current model for amorphous InGaZnO thin film transistors Journal of Applied Physics. 114: 184502
Tsormpatzoglou A, Hastas NA, Khan S, et al. (2012) Comparative Study of Active-Over-Metal and Metal-Over-Active Amorphous IGZO Thin-Film Transistors With Low-Frequency Noise Measurements Ieee Electron Device Letters. 33: 555-557
Choi N, Yoon SY, Kim CD, et al. (2012) Interface diffusion characteristics of Al-2 at.%Nd/n + a-Si:H and Al-2 at.%Nd/n + poly-Si bilayers Thin Solid Films. 520: 1982-1987
Choi N, Wee H, Nam S, et al. (2012) A modified offset roll printing for thin film transistor applications Microelectronic Engineering. 91: 93-97
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