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Alexander Neumann, Ph.D.

Affiliations: 
2013 Electrical Engineering University of New Mexico, Albuquerque, NM, United States 
Area:
Optics Physics, Electronics and Electrical Engineering
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Steven R. J. Brueck grad student 2013 Univ. of New Mexico
 (Imaging interferometric microscopy to the limits of available frequency space.)

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Publications

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Nezhadbadeh S, Neumann A, Zarkesh-Ha P, et al. (2020) Chirped-grating spectrometer-on-a-chip. Optics Express. 28: 24501-24510
Lee SC, Neumann A, Jiang YB, et al. (2016) Top-down, in-plane GaAs nanowire MOSFETs on an Al2O3 buffer with a trigate oxide from focused ion-beam milling and chemical oxidation. Nanotechnology. 27: 375707
Zamiri M, Plis E, Kim JO, et al. (2014) MWIR superlattice detectors integrated with substrate side-illuminated plasmonic coupler Proceedings of Spie - the International Society For Optical Engineering. 9070
Kuznetsova Y, Neumann A, Brueck SR. (2012) Solid-immersion imaging interferometric nanoscopy to the limits of available frequency space. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 29: 772-81
Neumann A, Kuznetsova Y, Brueck SR. (2008) Optical resolution below lambda/4 using synthetic aperture microscopy and evanescent-wave illumination. Optics Express. 16: 20477-83
Zhang Y, Gamble TC, Neumann A, et al. (2008) Electric field control and analyte transport in Si/SiO2 fluidic nanochannels. Lab On a Chip. 8: 1671-5
Neumann A, Kuznetsova Y, Brueck SR. (2008) Structured illumination for the extension of imaging interferometric microscopy. Optics Express. 16: 6785-93
Kuznetsova Y, Neumann A, Brueck SR. (2008) Imaging interferometric microscopy. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 25: 811-22
Zhang J, Zhang S, Li D, et al. (2007) Infrared transmission resonances in double-layered, complementary-structure metallic gratings. Optics Express. 15: 8737-44
Kuznetsova Y, Neumann A, Brueck SR. (2007) Imaging interferometric microscopy-approaching the linear systems limits of optical resolution. Optics Express. 15: 6651-63
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