Feng Qian, Ph.D.

Affiliations: 
2011 Engineering - Ph.D. University of California, Irvine, Irvine, CA 
Area:
Materials Science Engineering, Electronics and Electrical Engineering, Optics Physics
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"Feng Qian"

Parents

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Ozdal Boyraz grad student 2011 UC Irvine
 (Theoretical Analysis of Erbium Doped Structures on Gain and Characterization of Erbium Doped Particles.)
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Publications

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Huang Y, Kalyoncu SK, Tien EK, et al. (2011) eSNR improvement in indirect detection of mid-IR signals by wavelength conversion in SOS waveguides Proceedings of Spie - the International Society For Optical Engineering. 8155
Huang Y, Tien EK, Gao S, et al. (2011) Quasi-phase matching in SOI and SOS based parametric wavelength converters Proceedings of Spie - the International Society For Optical Engineering. 8120
Campione S, Qian F, Boyraz O, et al. (2011) Erbium-based plasmonic-assisted vertical emitter Ieee Photonic Society 24th Annual Meeting, Pho 2011. 662-663
Qian F, Song Q, Tien EK, et al. (2011) Effects of design geometries and nonlinear losses on gain in silicon waveguides with erbium-doped regions Ieee Journal of Quantum Electronics. 47: 327-334
Huang Y, Tien EK, Gao S, et al. (2011) Electrical signal-to-noise ratio improvement in indirect detection of mid-IR signals by wavelength conversion in silicon-on-sapphire waveguides Applied Physics Letters. 99
Tien EK, Huang Y, Gao S, et al. (2010) Discrete parametric band conversion in silicon for mid-infrared applications. Optics Express. 18: 21981-9
Qian F, Song Q, Tien EK, et al. (2010) Effects of nonlinear losses and design geometry on gain in silicon waveguides with erbium doped regions Optics Infobase Conference Papers
Qian F, Song Q, Tien EK, et al. (2009) Real time micro/nano particle detection and tracking with nanosecond resolution Proceedings of Spie - the International Society For Optical Engineering. 7402
Song Q, Qian F, Tien EK, et al. (2009) Imaging by silicon on insulator waveguides Applied Physics Letters. 94
Qian F, Song Q, Tien Ek, et al. (2009) Real-time optical imaging and tracking of micron-sized particles Optics Communications. 282: 4672-4675
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