Ozgur Kalenci, Ph.D.

Affiliations: 
2008 Columbia University, New York, NY 
Area:
Condensed Matter Physics, Materials Science Engineering
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Ismail C. Noyan grad student 2008 Columbia
 (A rigorous analysis of X -ray scattering from distorted single crystals.)
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Publications

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Kalenci Ö, Noyan IC. (2008) Applicability of real-space methods to diffraction strain measurements in single crystals Journal of Applied Crystallography. 41: 944-949
Kalenci O, Murray CE, Noyan IC. (2008) Local strain distributions in silicon-on-insulator/stressor-film composites Journal of Applied Physics. 104
Yan H, Kalenci O, Noyan IC, et al. (2008) Coherency effects in nanobeam x-ray diffraction analysis Journal of Applied Physics. 104
Murray CE, Saenger KL, Kalenci O, et al. (2008) Submicron mapping of silicon-on-insulator strain distributions induced by stressed liner structures Journal of Applied Physics. 104
Polvino SM, Murray CE, Kalenci O, et al. (2008) Synchrotron microbeam x-ray radiation damage in semiconductor layers Applied Physics Letters. 92
Yan H, Kalenci O, Noyan IC. (2007) Diffraction profiles of elastically bent single crystals with constant strain gradients Journal of Applied Crystallography. 40: 322-331
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