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Robert J. Friar, Ph.D.

Affiliations: 
2000 University of Texas at Austin, Austin, Texas, U.S.A. 
Area:
Electronics and Electrical Engineering
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Dean P. Neikirk grad student 2000 UT Austin
 (Analysis, design, and measurement of on -wafer transmission line test structures.)

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Friar RJ, Neikirk DP. (2000) Limitations on the extraction of loss tangent from submicron transmission line test structures Ieee Transactions On Advanced Packaging. 23: 393-397
Friar RJ, Neikirk DP. (1999) Limitations due to systematic phase errors on the extraction of loss tangent from micron-sized transmission line test structures Ieee Topical Meeting On Electrical Performance of Electronic Packaging. 67-70
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