Robert J. Friar, Ph.D.
Affiliations: | 2000 | University of Texas at Austin, Austin, Texas, U.S.A. |
Area:
Electronics and Electrical EngineeringGoogle:
"Robert Friar"Parents
Sign in to add mentorDean P. Neikirk | grad student | 2000 | UT Austin | |
(Analysis, design, and measurement of on -wafer transmission line test structures.) |
BETA: Related publications
See more...
Publications
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
Friar RJ, Neikirk DP. (2000) Limitations on the extraction of loss tangent from submicron transmission line test structures Ieee Transactions On Advanced Packaging. 23: 393-397 |
Friar RJ, Neikirk DP. (1999) Limitations due to systematic phase errors on the extraction of loss tangent from micron-sized transmission line test structures Ieee Topical Meeting On Electrical Performance of Electronic Packaging. 67-70 |