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Jang H. Sim, Ph.D.

Affiliations: 
2005 University of Texas at Austin, Austin, Texas, U.S.A. 
Area:
Electronics and Electrical Engineering
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Dim-Lee Kwong grad student 2005 UT Austin
 (Charge trapping effects on mobility and threshold voltage instability in high-k gate stacks.)

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Wen HC, Liu J, Sim JH, et al. (2005) Investigation of dopant effects in CoSi2 and NiSi fully silicided metal gates Electrochemical and Solid-State Letters. 8
Sim JH, Choi R, Lee BH, et al. (2005) Trapping/de-trapping gate bias dependence of Hf-silicate dielectrics with poly and TiN gate electrode Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 44: 2420-2423
Wen HC, Sim JH, Lu JP, et al. (2004) Effect of Ni thickness dependence on NiSi FUSI metal gate characteristics Electrochemical and Solid-State Letters. 7
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