Scott T. Dunham

Affiliations: 
Electrical Engineering University of Washington, Seattle, Seattle, WA 
Area:
Electronics and Electrical Engineering, Nanotechnology, Materials Science Engineering
Google:
"Scott Dunham"
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Chakravarthi S, Moore C, Opsvig A, et al. (2020) Window into NV center kinetics via repeated annealing and spatial tracking of thousands of individual NV centers Physical Review Materials. 4
Sommer DE, Dunham ST. (2018) Atomistic models of Cu diffusion in CuInSe2 under variations in composition Journal of Applied Physics. 123: 115116
Sommer DE, Mutter D, Dunham ST. (2017) Defects in Na-, K-, and Cd-Doped CuInSe$_2$ : Canonical Thermodynamics Based on Ab Initio Calculations Ieee Journal of Photovoltaics. 7: 1143-1152
Yazdani A, Chen R, Dunham ST. (2017) Coupled modeling of the competitive gettering of transition metals and impact on performance of lifetime sensitive devices Journal of Applied Physics. 121: 095702
Chakraborty P, Jin Y, Barrows CJ, et al. (2016) Kinetics of Isovalent (Cd2+) and Aliovalent (In3+) Cation Exchange in Cd1-xMnxSe Nanocrystals. Journal of the American Chemical Society
Mutter D, Dunham ST. (2015) Calculation of Defect Concentrations and Phase Stability in Cu2ZnSnS4 and Cu2ZnSnSe4 from Stoichiometry Ieee Journal of Photovoltaics. 5: 1188-1196
Dunham ST, Trzynadlowski BC. (2014) Modeling of oxygen precipitation in silicon Ecs Transactions. 64: 45-54
Dunham ST, Lai H, Chen R. (2014) Atomistic modeling of strained SiGe nanofins Ecs Transactions. 64: 557-572
Chen R, Trzynadlowski B, Dunham ST. (2014) Phosphorus vacancy cluster model for phosphorus diffusion gettering of metals in Si Journal of Applied Physics. 115
Liu Y, Dunham S, Baehr-Jones T, et al. (2013) Ultra-responsive phase shifters for depletion mode silicon modulators Journal of Lightwave Technology. 31: 3787-3793
See more...