Alan Feinerman

Affiliations: 
Electrical and Computer Engineering University of Illinois at Chicago, Chicago, IL, United States 
Area:
Electronics and Electrical Engineering
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"Alan Feinerman"
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Publications

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Feinerman A, Weddell J. (2018) Experimental percolation studies of random networks. The Review of Scientific Instruments. 88: 065114
Dankovic T, Hatch G, Feinerman A. (2015) Fabrication of plastic micro-channels for microfluidics solvent extraction Asme International Mechanical Engineering Congress and Exposition, Proceedings (Imece). 10
Correa C, Feinerman A. (2014) Percolation Properties of Triangles With Variable Aspect Ratios The Journal of Undergraduate Research At the University of Illinois At Chicago. 7
Grzebyk T, Górecka-Drzazga A, Dziuban JA, et al. (2014) Integration of a MEMS-type vacuum pump with a MEMS-type Pirani pressure gauge Technical Digest - 2014 27th International Vacuum Nanoelectronics Conference, Ivnc 2014. 206-207
Kannan Selvaraj S, Feinerman A, Takoudis CG. (2014) Growth behavior and properties of atomic layer deposited tin oxide on silicon from novel tin(II)acetylacetonate precursor and ozone Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 32
Grzebyk T, Górecka-Drzazga A, Dziuban JA, et al. (2014) Miniature integrated high-vacuum MEMS Procedia Engineering. 87: 891-894
Purahmad M, Huang J, Plakhotnyuk M, et al. (2013) A MEMS-based resistive vacuum gauge with voltage readout 2013 26th International Vacuum Nanoelectronics Conference, Ivnc 2013
Punchihewa KG, Zaker E, Kuljic R, et al. (2012) Comparisons between membrane, bridge and cantilever miniaturized resistive vacuum gauges. Sensors (Basel, Switzerland). 12: 8770-81
Dankovic T, Feinerman A. (2012) Electrostatically actuated compliant microvalve Asme International Mechanical Engineering Congress and Exposition, Proceedings (Imece). 9: 721-729
Zaker E, Farid S, Selvaraj SK, et al. (2012) Thermal-based MEMS vacuum gauges for measuring pressures from 10 -2 Torr to 10 -6 Torr Technical Digest - 25th International Vacuum Nanoelectronics Conference, Ivnc 2012. 280-281
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