W Timothy Holman
Affiliations: | Electrical Engineering | Vanderbilt University, Nashville, TN |
Area:
Electronics and Electrical EngineeringGoogle:
"W Holman"Children
Sign in to add traineeNicholas M. Atkinson | grad student | 2013 | Vanderbilt |
Raymond W. Blaine | grad student | 2014 | Vanderbilt |
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Publications
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Nsengiyumva P, Massengill LW, Kauppila JS, et al. (2018) Angular Effects on Single-Event Mechanisms in Bulk FinFET Technologies Ieee Transactions On Nuclear Science. 65: 223-230 |
Nsengiyumva P, Massengill LW, Alles ML, et al. (2017) Analysis of Bulk FinFET Structural Effects on Single-Event Cross Sections Ieee Transactions On Nuclear Science. 64: 441-448 |
Nsengiyumva P, Ball DR, Kauppila JS, et al. (2016) A Comparison of the SEU Response of Planar and FinFET D Flip-Flops at Advanced Technology Nodes Ieee Transactions On Nuclear Science |
Holman WT, Bhuva BL, Kauppila JS, et al. (2016) Advanced node-splitting techniques for radiation-hardened analog/mixed-signal circuits Ieee Aerospace Conference Proceedings. 2016 |
Shetler KJ, Atkinson NM, Holman WT, et al. (2015) Radiation Hardening of Voltage References Using Chopper Stabilization Ieee Transactions On Nuclear Science |
Maharrey JA, Quinn RC, Loveless TD, et al. (2013) Effect of device variants in 32 nm and 45 nm SOI on SET pulse distributions Ieee Transactions On Nuclear Science. 60: 4399-4404 |
Maillard P, Holman WT, Loveless TD, et al. (2013) A new error correction circuit for delay locked loops Ieee Transactions On Nuclear Science. 60: 4387-4393 |
Atkinson NM, Holman WT, Kauppila JS, et al. (2013) The quad-path hardening technique for switched-capacitor circuits Ieee Transactions On Nuclear Science. 60: 4356-4361 |
Atkinson NM, Blaine RW, Kauppila JS, et al. (2013) RHBD technique for single-event charge cancellation in folded-cascode amplifiers Ieee Transactions On Nuclear Science. 60: 2756-2761 |
Blaine RW, Atkinson NM, Kauppila JS, et al. (2012) Differential charge cancellation (DCC) layout as an rhbd technique for bulk CMOS differential circuit design Ieee Transactions On Nuclear Science. 59: 2867-2871 |