Thomas A. Rawdanowicz, Ph.D.
Affiliations: | 2005 | North Carolina State University, Raleigh, NC |
Area:
Materials Science EngineeringGoogle:
"Thomas Rawdanowicz"Parents
Sign in to add mentor| Jagdish Narayan | grad student | 2005 | NCSU | |
| (Laser molecular beam epitaxial growth and properties of III-nitride thin film heterostructures on silicon.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Ojha SK, Kasanaboina PK, Lewis Reynolds C, et al. (2016) Incorporation of Be dopant in GaAs core and core-shell nanowires by molecular beam epitaxy Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 34 |
| Seifikar S, Rawdanowicz T, Straka W, et al. (2014) Structural and magnetic properties of sol-gel derived NiFe 2O4 thin films on silicon substrates Journal of Magnetism and Magnetic Materials. 361: 255-261 |
| Seifikar S, Tabei A, Sachet E, et al. (2012) Growth of (111) oriented NiFe 2O 4 polycrystalline thin films on Pt (111) via sol-gel processing Journal of Applied Physics. 112 |
| Bharatan S, Iyer S, Li J, et al. (2011) Study of molecular beam epitaxially grown InGaAsSbN/GaSb single quantum wells Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 29 |
| Rawdanowicz TA, Narayan J. (2004) Epitaxial GaN on Si(111): Process control of SiN x interlayer formation Applied Physics Letters. 85: 133-135 |
| Rawdanowicz TA, Iyer S, Mitchel WC, et al. (2002) Electronic properties of heteroepitaxial undoped and n-InSb epilayers using SnTe source by molecular beam epitaxy Journal of Applied Physics. 92: 296-301 |
| Rawdanowicz TA, Wang H, Kvit A, et al. (2002) Studies on epitaxial relationship and interface structure of AlN/Si(111) and GaN/Si(111) heterostructures Materials Research Society Symposium - Proceedings. 743: 151-156 |
| Rawdanowicz TA, Sankar J, Narayan J, et al. (2000) Hardness and elastic modulus measurements of AlN and TiN sub-micron thin films using the continuous stiffness measurement technique with FEM analysis Materials Research Society Symposium - Proceedings. 594: 507-512 |
| Rawdanowicz TA, Godbole V, Narayan J, et al. (1999) Hardnesses and elastic moduli of pulsed laser deposited multilayer AlN/TiN thin films Composites Part B: Engineering. 30: 657-665 |