Raymond W. Blaine, Ph.D.
Affiliations: | 2014 | Vanderbilt University, Nashville, TN |
Area:
Electronics and Electrical EngineeringGoogle:
"Raymond Blaine"Parents
Sign in to add mentor| W Timothy Holman | grad student | 2014 | Vanderbilt | |
| (The design of single-event hardened analog and mixed-signal circuits.) | ||||
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| Atkinson NM, Blaine RW, Kauppila JS, et al. (2013) RHBD technique for single-event charge cancellation in folded-cascode amplifiers Ieee Transactions On Nuclear Science. 60: 2756-2761 |
| Blaine RW, Atkinson NM, Kauppila JS, et al. (2012) Differential charge cancellation (DCC) layout as an rhbd technique for bulk CMOS differential circuit design Ieee Transactions On Nuclear Science. 59: 2867-2871 |
| Loveless TD, Kauppila JS, Jagannathan S, et al. (2012) On-chip measurement of single-event transients in a 45 nm silicon-on-insulator technology Ieee Transactions On Nuclear Science. 59: 2748-2755 |
| Blaine RW, Atkinson NM, Kauppila JS, et al. (2012) Single-event-hardened CMOS operational amplifier design Ieee Transactions On Nuclear Science. 59: 803-810 |
| Armstrong SE, Blaine RW, Holman WT, et al. (2012) Single-event analysis and hardening of mixed-signal circuit interfaces in high-speed communications devices Ieee Transactions On Nuclear Science. 59: 1027-1033 |
| Blaine RW, Armstrong SE, Kauppila JS, et al. (2011) RHBD bias circuits utilizing sensitive node active charge cancellation Ieee Transactions On Nuclear Science. 58: 3060-3066 |
| Armstrong SE, Blaine RW, Holman WT, et al. (2011) Single-event vulnerability of mixed-signal circuit interfaces Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 485-488 |
| Blaine RW, Atkinson NM, Kauppila JS, et al. (2011) A single-event-hardened CMOS operational amplifier design Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 123-127 |