James Moyne
Affiliations: | Mechanical Engineering | University of Michigan, Ann Arbor, Ann Arbor, MI |
Area:
Mechanical Engineering, Electronics and Electrical Engineering, System Science EngineeringGoogle:
"James Moyne"
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Publications
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| Moyne J, Qamsane Y, Balta EC, et al. (2020) A Requirements Driven Digital Twin Framework: Specification and Opportunities Ieee Access. 8: 107781-107801 |
| Lopez F, Shao Y, Mao ZM, et al. (2018) A software-defined framework for the integrated management of smart manufacturing systems Manufacturing Letters. 15: 18-21 |
| Anand D, Moyne J, Tilbury DM. (2014) A method for reducing noise and complexity in yield analysis for manufacturing process workflows Ieee Transactions On Semiconductor Manufacturing. 27: 501-514 |
| Moyne J, Yedatore M, Iskandar J, et al. (2014) Chamber matching across multiple dimensions utilizing Predictive Maintenance, Equipment Health Monitoring, Virtual Metrology and Run-To-Run control Asmc (Advanced Semiconductor Manufacturing Conference) Proceedings. 86-91 |
| Moyne J. (2010) Utilizing run-to-run control to improve process capability and reduce waste in lithography: Case studies in semiconductor and display manufacturing, and a vision for the future Proceedings of Spie - the International Society For Optical Engineering. 7638 |
| Moyne J, Schulze B. (2010) Yield management enhanced advanced process control system (YMeAPC) part I: Description and case study of feedback for optimized multiprocess control Ieee Transactions On Semiconductor Manufacturing. 23: 221-235 |
| Anand DM, Fletcher JG, Li-Baboud Y, et al. (2010) A practical implementation of distributed system control over an asynchronous Ethernet network using time stamped data 2010 Ieee International Conference On Automation Science and Engineering, Case 2010. 515-520 |
| Olson K, Moyne J. (2010) Adaptive Virtual Metrology applied to a CVD process Asmc (Advanced Semiconductor Manufacturing Conference) Proceedings. 353-358 |
| Anand DM, Sharma D, Li-Baboud Y, et al. (2009) EDA performance and clock synchronization over a wireless network: Analysis, experimentation and application to semiconductor manufacturing Ieee International Symposium On Precision Clock Synchronization For Measurement, Control and Communication, Ispcs '09 - Proceedings. 81-86 |
| Anand DM, Moyne JR, Tilbury DM. (2009) Performance evaluation of wireless networks for factory automation applications 2009 Ieee International Conference On Automation Science and Engineering, Case 2009. 340-346 |