George S. La Rue
Affiliations: | Electrical Engineering | Washington State University, Pullman, WA, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"George La Rue"Children
Sign in to add traineeHaidong Guo | grad student | 2006 | WSU |
Zhihe Zhou | grad student | 2006 | WSU |
Dirk J. Robinson | grad student | 2008 | WSU |
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Publications
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Krishnamurthy HK, Robinson D, Rector DM, et al. (2010) A low noise low power DC coupled sensor amplifier with offset cancellation Wmed 2010 - 8th Ieee Workshop On Microelectronics and Electron Devices. 44-47 |
Caracciolo H, Bonizzoni E, Maloberti F, et al. (2010) Digitally assisted multi-bit ΣΔ modulator Iscas 2010 - 2010 Ieee International Symposium On Circuits and Systems: Nano-Bio Circuit Fabrics and Systems. 3993-3996 |
Zhou Z, La Rue GS. (2008) A 12-bit nonlinear DAC for direct digital frequency synthesis Ieee Transactions On Circuits and Systems I: Regular Papers. 55: 2459-2468 |
Zahller MJ, La Rue GS. (2006) 40 Gbps SiGe pattern generator IC with variable clock skew and output levels 2006 Ieee Workshop On Microelectronics and Electron Devices, Wmed'06. 9-10 |
Zhang R, La Rue GS. (2006) Fast acquisition clock and data recovery circuit with low jitter Ieee Journal of Solid-State Circuits. 41: 1016-1024 |
Zhou Z, Horowitz I, La Rue GS. (2005) Design of a radiation-hard DDFS 2005 Ieee Workshop On Microelectronics and Electron Devices, Wmed. 2005: 88-91 |
Guo H, Rector DM, La Rue GS. (2005) A low-power 16-bit 500 kS/s ADC 2005 Ieee Workshop On Microelectronics and Electron Devices, Wmed. 2005: 84-87 |
Horowitz I, La Rue GS. (2005) Parallel phase accumulator architecture for DDFS 2005 Ieee Workshop On Microelectronics and Electron Devices, Wmed. 2005: 63-66 |
Champion CL, La Rue GS. (2005) Accurate SPICE models for CMOS analog radiation-hardness-by-design Ieee Transactions On Nuclear Science. 52: 2542-2549 |
Zhang R, La Rue GS. (2004) Clock and data recovery circuits with fast acquisition and low jitter Ieee Workshop On Microelectronics and Electron Devices, Wmed: Ieee Electron Devices Northwest Regional Meeting. 48-51 |