Manas Ojha, Ph.D.

Affiliations: 
2008 Rensselaer Polytechnic Institute, Troy, NY, United States 
Area:
Chemical Engineering
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"Manas Ojha"

Parents

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Joel L. Plawsky grad student 2008 RPI
 (Contact line wettability and transport during phase change processes from nanostructured surfaces.)
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Publications

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Ojha M, Chatterjee A, Dalakos G, et al. (2010) Role of solid surface structure on evaporative phase change from a completely wetting corner meniscus Physics of Fluids. 22: 1-15
Ojha M, Chatterjee A, Mont F, et al. (2010) The role of solid surface structure on dropwise phase change processes International Journal of Heat and Mass Transfer. 53: 910-922
Plawsky JL, Ojha M, Chatterjee A, et al. (2009) Review of the effects of surface topography, surface chemistry, and fluid physics on evaporation at the contact line Chemical Engineering Communications. 196: 658-696
Ojha M, Gill WN, Plawsky JL, et al. (2006) Fabrication of ultrathin (∼100 nm), low-index nanoporous silica films for photonic devices: Role of substrate adhesion on the film thickness Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 24: 1109-1116
Xi JQ, Ojha M, Cho W, et al. (2006) Internal omni-directional reflector using a low refractive index material for light-emitting diodes Optics Infobase Conference Papers
Xi JQ, Ojha M, Cho W, et al. (2006) Internal omni-directional reflector using a low refractive index material for light-emitting diodes Optics Infobase Conference Papers
Xi JQ, Ojha M, Cho W, et al. (2005) Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material. Optics Letters. 30: 1518-20
Xi JQ, Ojha M, Cho W, et al. (2005) Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material Optics Letters. 30: 1518-1520
Cho W, Saxena R, Rodriguez O, et al. (2005) Polymer penetration and pore sealing in nanoporous silica by CHF 3 plasma exposure Journal of the Electrochemical Society. 152
Cho W, Rodriguez O, Saxena R, et al. (2005) A model for the etching of nanoporous silica in C4F8 plasmas based on pore geometry and porosity effects Journal of the Electrochemical Society. 152
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