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Nabeeh Kandalaft, Ph.D.

Affiliations: 
2012 Electrical Engineering University of Windsor, Windsor, Canada 
Area:
Electronics and Electrical Engineering
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"Nabeeh Kandalaft"
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Parents

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Majid Ahmadi grad student 2012 University of Windsor
 (High Speed Test Interface Module Using MEMS Technology.)
Rashid Rashidzadeh grad student 2012 University of Windsor
 (High Speed Test Interface Module Using MEMS Technology.)

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Publications

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Kandalaft N, Attaran A, Rashizadeh R. (2015) High speed test interface module using MEMS technology Microelectronics Reliability. 55: 374-382
Kandalaft N, Basith II, Rashidzadeh R. (2014) Low-contact resistance probe card using MEMS technology Ieee Transactions On Instrumentation and Measurement. 63: 2882-2889
Kandalaft N, Rashidzadeh R, Ahmadi M. (2013) Testing 3-D IC through-silicon-vias (TSVs) by direct probing Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 32: 538-546
Basith II, Kandalaft N, Rashidzadeh R, et al. (2013) Charge-controlled readout and bist circuit for MEMS sensors Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 32: 433-441
Kandalaft N, Rashidzadeh R, Ahmadi M. (2011) A signal integrity enhancement technique for high speed test systems Canadian Conference On Electrical and Computer Engineering. 001300-001303
Kandalaft N, Basith I, Rashidzadeh R. (2010) A MEMS based Device Interface Board Proceedings - International Test Conference
Basith II, Kandalaft N, Rashidzadeh R. (2010) Built-in Self-Test for capacitive MEMS using a charge control technique Proceedings of the Asian Test Symposium. 135-140
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