Eric P. Guyer, Ph.D.
Affiliations: | 2005 | Stanford University, Palo Alto, CA |
Area:
Materials Science Engineering, Electronics and Electrical Engineering, Physical ChemistryGoogle:
"Eric Guyer"Parents
Sign in to add mentorReinhold H. Dauskardt | grad student | 2005 | Stanford | |
(The effects of aqueous solution chemistry on the fracture of nanoporous thin-films.) |
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Publications
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Han SM, Guyer EP, Nix WD. (2011) Extracting thin film hardness of extremely compliant films on stiff substrates Thin Solid Films. 519: 3221-3224 |
Guyer EP, Gantz J, Dauskardt RH. (2007) Aqueous solution diffusion in hydrophobic nanoporous thin-film glasses Journal of Materials Research. 22: 710-718 |
Houle FA, Guyer E, Miller DC, et al. (2007) Adhesion between template materials and UV-cured nanoimprint resists Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 25: 1179 |
Guyer EP, Patz M, Dauskardt RH. (2006) Fracture of nanoporous methyl silsesquioxane thin-film glasses Journal of Materials Research. 21: 882-894 |
Gage DM, Guyer EP, Stebbins JF, et al. (2006) UV curing effects on glass structure and mechanical properties of organosilicate low-k thin films 2006 International Interconnect Technology Conference, Iitc. 149-151 |
Iacopi F, Travaly Y, Eyckens B, et al. (2006) Short-ranged structural rearrangement and enhancement of mechanical properties of organosilicate glasses induced by ultraviolet radiation Journal of Applied Physics. 99 |
Iacopi F, Waldfried C, Houthoofd K, et al. (2006) UV -assisted curing: An effective technique for toughening low-k organosilicate films Advanced Metallization Conference (Amc). 247-254 |
Guyer EP, Dauskardt RH. (2005) Effect of solution pH on the accelerated cracking of nanoporous thin-film glasses Journal of Materials Research. 20: 680-687 |
Guyer EP, Dauskardt RH. (2005) Effect of porosity on reducing cohesive strength and accelerating crack growth in ultra low-k thin-films Proceedings of the Ieee 2005 International Interconnect Technology Conference, Iitc. 223-225 |
Guyer EP, Dauskardt RH. (2005) Accelerated debonding and cracking in thin-film structures: Chemical reaction rate and loading effects 11th International Conference On Fracture 2005, Icf11. 8: 6111-6116 |