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Lucille A. Giannuzzi

Affiliations: 
University of Central Florida, Orlando, FL, United States 
Area:
Materials Science Engineering
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"Lucille Giannuzzi"
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Parents

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Children

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Hanlin Zhang grad student 2000 University of Central Florida
Brian W. Kempshall grad student 2001 University of Central Florida
Stephen M. Schwarz grad student 2002 University of Central Florida

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Publications

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Vitale S, Sugar JD, Cappillino PJ, et al. (2016) Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam Microscopy and Microanalysis. 22: 180-181
Bassim N, Scott K, Giannuzzi LA. (2014) Recent advances in focused ion beam technology and applications Mrs Bulletin. 39: 317-325
Giannuzzi LA. (2012) Optimizing morphology and structure with multi-signal FIB/SEM tomography Materials Research Society Symposium Proceedings. 1421: 47-52
Giannuzzi LA, Gorman BP. (2009) Particle-induced x-ray emission in stainless steel using 30 keV Ga+ focused ion beams Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 27: 668-671
Giannuzzi LA, Utlaut M. (2009) Contrast mechanisms in ga+ ion induced secondary electron images Microscopy and Microanalysis. 15: 650-651
Van Leer B, Giannuzzi LA. (2008) Advances in TEM sample preparation using a focused ion beam Microscopy and Microanalysis. 14: 380-381
Russo MF, Maazouz M, Giannuzzi LA, et al. (2008) Gallium-induced milling of silicon: A computational investigation of focused ion beams Microscopy and Microanalysis. 14: 315-320
Russo MF, Maazouz M, Giannuzzi LA, et al. (2008) Trench formation and lateral damage induced by gallium milling of silicon Applied Surface Science. 255: 828-830
Giannuzzi LA, Phifer D, Giannuzzi NJ, et al. (2007) Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy. Journal of Oral and Maxillofacial Surgery : Official Journal of the American Association of Oral and Maxillofacial Surgeons. 65: 737-47
Stokes DJ, Roussel L, Wilhelmi O, et al. (2007) Recent advances in FIB technology for nano-prototyping and nano-characterisation Materials Research Society Symposium Proceedings. 1020: 15-20
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